ROTATION AND SCALE INVARIANT
Experts
- V. Javier Traver
- Martin J. Bastiaans
- Biswanath N. Chatterji
- Wei-Ming Chen
- Nicolai Petkov
- Vinod Chandran
- David Hafner
- Ingemar J. Cox
- Liangqi Zhang
- George Azzopardi
- Min-Ki Kim
- Salvatore Tabbone
- Christoph von der Malsburg
- Lance R. Williams
- Veli Mäkinen
- Chi-Man Pun
- Erdem Akagündüz
- Janne Heikkilä
- Jeffrey A. Bloom
- Yongsheng Gao
- Joachim Weickert
- Moon-Chuen Lee
- Thai V. Hoang
- Oliver Demetz
- Yihao Luo
- Tianjiang Wang
- Arno J. van Leest
- Kin-Man Lam
- Karvel K. Thornber
- Gonzalo Navarro
- Min Wu
- Kimmo Fredriksson
- Min-Hung Yeh
- Jenia Jitsev
- Filiberto Pla
- Matthew L. Miller
- Yasuomi D. Sato
- Farhan Riaz
- Soo-Chang Pei
Venues
- CoRR
- ICASSP
- Pattern Recognit.
- IEEE Trans. Image Process.
- ICIP
- Pattern Recognit. Lett.
- J. Electronic Imaging
- Signal Process.
- IVCNZ
- ICPR
- Comput. Vis. Image Underst.
- ISVC (2)
- ICCV Workshops
- BMVC
- IEEE Trans. Pattern Anal. Mach. Intell.
- Image Vis. Comput.
- Int. J. Pattern Recognit. Artif. Intell.
- PSIVT
- ISCAS
- ICIP (3)
- EURASIP J. Adv. Signal Process.
- DICTA
- NIPS
- EMBC
- IEEE Trans. Inf. Theory
- VISIGRAPP (4: VISAPP)
- EUSIPCO
- PacificVis
- J. Mach. Learn. Res.
- J. Assoc. Inf. Sci. Technol.
- VCIP
- ISSPA
- CBMS
- Informatica (Slovenia)
- Systems and Computers in Japan
- ECCV (4)
- Sensors
- Int. J. Geogr. Inf. Sci.
- ESANN
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