RESULT QUALITY
Experts
- Ke-Horng Chen
- Kang-Yoon Lee
- Anastasia Ailamaki
- Anna Sasak-Okon
- Goetz Graefe
- Patrick Valduriez
- Luc Bouganim
- Evangelos Kanoulas
- Wentao Wu
- Quan Xue
- Oren Weimann
- Volker Markl
- Thiago Batista Soeiro
- Tsung-Yen Tsai
- Keum-Cheol Hwang
- Yuh-Shyan Hwang
- Thomas Heinis
- Jiann-Jong Chen
- Hakan Hacigümüs
- José M. Burdio
- Harumi A. Kuno
- Oscar Lucía
- Maarten de Rijke
- Sang-Kyoo Han
- Gun-Woo Moon
- Ramesh K. Pokharel
- Marek Tudruj
- Hector Sarnago
- Youngoo Yang
- Pawel Gawrychowski
- Shay Mozes
- Ying-Hsi Lin
- Xiu Yin Zhang
- Jeffrey F. Naughton
- Janet L. Wiener
- Yuanyuan Zhu
- Yvon Savaria
- Shian-Ru Lin
- Bong-Hwan Kwon
Venues
- CoRR
- IEEE Trans. Ind. Electron.
- IEEE Access
- IECON
- ISCAS
- Sensors
- IEEE J. Solid State Circuits
- IEEE Trans. Circuits Syst. II Express Briefs
- SIGIR
- IEEE Trans. Circuits Syst. I Regul. Pap.
- IEICE Electron. Express
- IEICE Trans. Electron.
- ICDE
- SIGMOD Conference
- Microelectron. J.
- MWSCAS
- ICECS
- OFC
- WWW (Companion Volume)
- IAS
- ISOCC
- IEEE Trans. Instrum. Meas.
- CIDR
- AAAI
- VLDB
- Quantum Inf. Process.
- CIKM
- Proc. VLDB Endow.
- ISSCC
- ESSCIRC
- DaMoN
- Int. J. Autom. Technol.
- IEEE Trans. Very Large Scale Integr. Syst.
- EDBT
- ASP-DAC
- ICASSP
- IEEE Trans. Veh. Technol.
- ICIRA (2)
- WWW
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