RESULT QUALITY
Experts
- Ke-Horng Chen
- Kang-Yoon Lee
- Anastasia Ailamaki
- Anna Sasak-Okon
- Goetz Graefe
- Evangelos Kanoulas
- Wentao Wu
- Luc Bouganim
- Patrick Valduriez
- Oscar Lucía
- Keum-Cheol Hwang
- Tsung-Yen Tsai
- Thiago Batista Soeiro
- Yuh-Shyan Hwang
- Jiann-Jong Chen
- Jeffrey F. Naughton
- Harumi A. Kuno
- Yuanyuan Zhu
- Oren Weimann
- Volker Markl
- Maarten de Rijke
- Yvon Savaria
- Sang-Kyoo Han
- Youngoo Yang
- Shian-Ru Lin
- Shay Mozes
- Ramesh K. Pokharel
- Hector Sarnago
- Thomas Heinis
- Bong-Hwan Kwon
- Gun-Woo Moon
- Hakan Hacigümüs
- Xiu Yin Zhang
- Janet L. Wiener
- Pawel Gawrychowski
- Marek Tudruj
- Quan Xue
- Ying-Hsi Lin
- José M. Burdio
Venues
- CoRR
- IEEE Trans. Ind. Electron.
- IEEE Access
- IECON
- ISCAS
- Sensors
- IEEE Trans. Circuits Syst. II Express Briefs
- IEEE J. Solid State Circuits
- SIGIR
- IEEE Trans. Circuits Syst. I Regul. Pap.
- IEICE Electron. Express
- IEICE Trans. Electron.
- ICDE
- SIGMOD Conference
- MWSCAS
- ICECS
- OFC
- Microelectron. J.
- WWW (Companion Volume)
- IAS
- ISOCC
- CIKM
- CIDR
- VLDB
- IEEE Trans. Instrum. Meas.
- AAAI
- Quantum Inf. Process.
- IEEE Trans. Very Large Scale Integr. Syst.
- ISSCC
- Proc. VLDB Endow.
- Int. J. Autom. Technol.
- ESSCIRC
- DaMoN
- WWW
- J. Circuits Syst. Comput.
- ICIRA (2)
- Proc. IEEE
- IEEE Trans. Veh. Technol.
- Expert Syst. Appl.
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