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Experts
- Sonya A. Coleman
- Bryan W. Scotney
- Bryan Gardiner
- Janez Zerovnik
- Felix Breuer
- Frank Sottile
- Chungang Zhu
- Rik Van de Walle
- D. Gnanaraj Thomas
- Dimitri Van De Ville
- Shanmugalingam Suganthan
- Paul S. Bonsma
- Rafal Witkowski
- Ignace Lemahieu
- Prateek Mittal
- Dacheng Tao
- Zhaoyang Huang
- Yuxiang Shao
- Hongsheng Li
- Shengyong Chen
- Jin Ben
- Amir Vaxman
- Guy Shani
- Maura Pintor
- Daniele Angioni
- Mingxi Zhao
- Sisi Zhao
- Guofeng Zhang
- Youssef Hamadi
- Thomas Durieux
- Xin Xia
- Ahmed Zgaren
- Ahmed Patel
- Alphan Es
- Yosef E. Maruvka
- Battista Biggio
- Guglielmo Camporese
- Jesus Selva
- Cairong Wang
Venues
- CoRR
- IEEE Access
- Comput. Aided Geom. Des.
- CVPR
- Comput. Aided Des.
- Sensors
- J. Comput. Phys.
- Appl. Math. Comput.
- Trans. GIS
- ICIP
- IEEE Trans. Image Process.
- Inf. Process. Lett.
- Math. Comput. Simul.
- Pattern Recognit. Lett.
- ACM Trans. Graph.
- MWSCAS
- IEEE Geosci. Remote. Sens. Lett.
- Appl. Math. Lett.
- SIAM J. Math. Anal.
- Ars Comb.
- IEEE Trans. Computers
- ICSE
- IEEE SENSORS
- Comput. Geosci.
- ACM Multimedia
- ICASSP
- USENIX Security Symposium
- IEEE Trans. Autom. Control.
- ISCAS
- CRV
- Adv. Eng. Softw.
- IEICE Trans. Inf. Syst.
- IET Image Process.
- J. Parallel Distributed Comput.
- ALIFE
- J. Math. Imaging Vis.
- SIAM J. Appl. Math.
- ICIAP
- ICLR
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