REFLECTION COMPONENTS
Experts
- Paul E. Debevec
- Abhijeet Ghosh
- Takahiro Okabe
- Katsushi Ikeuchi
- Pieter Peers
- Ko Nishino
- Stephen Lin
- Lawrence B. Wolff
- Heung-Yeung Shum
- Kosuke Sato
- Tinne Tuytelaars
- Giuseppe Claudio Guarnera
- Graham Fyffe
- Takashi Imamura
- Tobias Ritschel
- Qifeng Chen
- Yusuke Monno
- Daniel Cohen-Or
- Tetsuo Miyake
- Tiziano Portenier
- Terrance E. Boult
- Kenji Hara
- Tongbo Chen
- Jianwei Yang
- Kun-Shan Chen
- Shihao Wu
- Luc Van Gool
- Matthias Zwicker
- Miki Morimatsu
- Hui Huang
- Zorana Jelenak
- Chang-Hwan Son
- Sijia Wen
- Jun-ichi Takada
- Yeong-Ho Ha
- Imari Sato
- Paul S. Chang
- Mario Fritz
- Matan Sela
Venues
- CoRR
- CVPR
- IEEE Trans. Geosci. Remote. Sens.
- Color Imaging Conference
- IEEE Trans. Image Process.
- ACM Trans. Graph.
- MVA
- ICIP
- IEEE Trans. Pattern Anal. Mach. Intell.
- Remote. Sens.
- WACV
- J. Imaging
- ICIAR
- Sensors
- IGARSS
- PIMRC
- Comput. Graph. Forum
- SIGGRAPH Posters
- CVPR (1)
- VMV
- ICCV
- CIC
- WHISPERS
- IEICE Electron. Express
- BMVC
- CIARP
- IEICE Trans. Fundam. Electron. Commun. Comput. Sci.
- EGSR (EI&I)
- ICASSP
- OFC
- IEEE Trans. Signal Process.
- Neurocomputing
- Int. J. Comput. Vis.
- IEEE Geosci. Remote. Sens. Lett.
- ACCV (1)
- ACCV (5)
- ICRA
- ISMAR Adjunct
- Reflection
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