REFLECTANCE MODEL
Experts
- Edwin R. Hancock
- Paul E. Debevec
- Katsushi Ikeuchi
- Boxin Shi
- Abhijeet Ghosh
- Pieter Peers
- Imari Sato
- Ko Nishino
- Yasuyuki Matsushita
- Philip L. Worthington
- Michael Breuß
- Shree K. Nayar
- Jonathan T. Barron
- Siu-Yeung Cho
- Qinhuo Liu
- William A. P. Smith
- Tommy W. S. Chow
- Graham Fyffe
- Daisuke Miyazaki
- Daniel Cremers
- Yue Dong
- Osamu Ikeda
- Aly A. Farag
- Yoichi Sato
- Shinsaku Hiura
- Alfred M. Bruckstein
- Michael S. Langer
- Aswin C. Sankaranarayanan
- Jean-Denis Durou
- Jun Sato
- Qian Zheng
- Ron Kimmel
- Yixin Zhang
- Zhuo Hui
- Kalyan Sunkavalli
- Ping Tan
- Brian V. Funt
- Roberto Mecca
- Philippe Bekaert
Venues
- CoRR
- CVPR
- IEEE Trans. Pattern Anal. Mach. Intell.
- Remote. Sens.
- ACM Trans. Graph.
- ICCV
- IGARSS
- IEEE Trans. Geosci. Remote. Sens.
- Comput. Graph. Forum
- IEEE Trans. Image Process.
- BMVC
- ICIP
- MVA
- Int. J. Comput. Vis.
- 3DV
- Image Vis. Comput.
- Color Imaging: Displaying, Processing, Hardcopy, and Applications
- Systems and Computers in Japan
- Comput. Vis. Image Underst.
- ICPR
- CIC
- AAAI
- SIGGRAPH Posters
- Sensors
- SIGGRAPH Talks
- Rendering Techniques
- DAGM-Symposium
- IEEE Access
- Int. J. Appl. Earth Obs. Geoinformation
- CGIV/MCS
- IEEE Computer Graphics and Applications
- Pattern Recognit. Lett.
- ICCP
- Multim. Tools Appl.
- CVPR (2)
- DICTA
- IJCAI
- VISAPP (2)
- Measuring, Modeling, and Reproducing Material Appearance
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