REFLECTANCE MODEL
Experts
- Edwin R. Hancock
- Paul E. Debevec
- Katsushi Ikeuchi
- Boxin Shi
- Abhijeet Ghosh
- Pieter Peers
- Ko Nishino
- Yasuyuki Matsushita
- Imari Sato
- Philip L. Worthington
- Michael Breuß
- Shree K. Nayar
- Daisuke Miyazaki
- Yue Dong
- Tommy W. S. Chow
- Siu-Yeung Cho
- William A. P. Smith
- Jonathan T. Barron
- Qinhuo Liu
- Osamu Ikeda
- Graham Fyffe
- Daniel Cremers
- Ravi Ramamoorthi
- Aly A. Farag
- Fumihiko Sakaue
- Yixin Zhang
- Qian Zheng
- Jun Sato
- Hossein Ragheb
- Philippe Bekaert
- Kalyan Sunkavalli
- Brian V. Funt
- Ping Tan
- Zhuo Hui
- Yoichi Sato
- Ron Kimmel
- Xin Tong
- Jean-Denis Durou
- Lawrence B. Wolff
Venues
- CoRR
- CVPR
- IEEE Trans. Pattern Anal. Mach. Intell.
- Remote. Sens.
- ICCV
- ACM Trans. Graph.
- IGARSS
- IEEE Trans. Geosci. Remote. Sens.
- Comput. Graph. Forum
- IEEE Trans. Image Process.
- BMVC
- ICIP
- MVA
- Int. J. Comput. Vis.
- 3DV
- ICPR
- Color Imaging: Displaying, Processing, Hardcopy, and Applications
- Image Vis. Comput.
- Comput. Vis. Image Underst.
- Systems and Computers in Japan
- SIGGRAPH Posters
- AAAI
- Sensors
- CIC
- SIGGRAPH Talks
- ICCP
- IEEE Access
- Int. J. Appl. Earth Obs. Geoinformation
- DAGM-Symposium
- Rendering Techniques
- CGIV/MCS
- Pattern Recognit. Lett.
- IEEE Computer Graphics and Applications
- IROS
- IEEE J. Sel. Top. Appl. Earth Obs. Remote. Sens.
- IEEE Trans. Vis. Comput. Graph.
- VISIGRAPP (4: VISAPP)
- ICIP (2)
- Color Imaging Conference
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