REFLECTANCE MAP
Experts
- Edwin R. Hancock
- Roberto Mecca
- Yvain Quéau
- Yasuyuki Matsushita
- Roberto Cipolla
- Michael Breuß
- Jean-Denis Durou
- Alfred M. Bruckstein
- Philip L. Worthington
- Boxin Shi
- Osamu Ikeda
- Fotios Logothetis
- Ryszard Kozera
- David J. Kriegman
- Daniel Cremers
- Junyu Dong
- Satoshi Ikehata
- Melvyn L. Smith
- Pieter Peers
- Yong Chul Ju
- Minoru Asada
- William A. P. Smith
- Andrew Zisserman
- Andrés Bruhn
- David A. Forsyth
- José R. A. Torreão
- Vasileios Argyriou
- Ronen Basri
- Hemant D. Tagare
- Atsushi Hashimoto
- Toshikazu Wada
- Yuji Iwahori
- Michihiko Minoh
- Mike J. Chantler
- Mubarak Shah
- Rui Huang
- James C. Bieron
- Masaaki Iiyama
- Jiuai Sun
Venues
- CVPR
- CoRR
- IEEE Trans. Pattern Anal. Mach. Intell.
- ICCV
- Int. J. Comput. Vis.
- Pattern Recognit. Lett.
- ICIP
- BMVC
- Image Vis. Comput.
- ICPR (1)
- Pattern Recognit.
- Comput. Vis. Image Underst.
- MVA
- SSVM
- J. Math. Imaging Vis.
- ACM Trans. Graph.
- ICIP (2)
- ICPR
- CAIP
- Comput. Graph.
- IJCAI
- 3DV
- IEEE Computer Graphics and Applications
- CVPR (1)
- Systems and Computers in Japan
- ECCV (2)
- Mach. Vis. Appl.
- IEEE Access
- ACCV (4)
- AAAI
- DAGM-Symposium
- VISAPP (2)
- ICNC (5)
- Comput. Vis. Graph. Image Process.
- ECCV Workshops (1)
- ECCV (3)
- ECCV
- ICCV Workshops
- Signal Process.
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