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Experts
- Kazuaki Sawada
- Matteo Perenzoni
- David Stoppa
- Eugenio Culurciello
- Eric R. Fossum
- Takayuki Hamamoto
- Min-Woong Seo
- Shoji Kawahito
- Kazuhiro Takahashi
- Nicola Massari
- Shoushun Chen
- Paul E. Debevec
- Kiyoharu Aizawa
- Michael Broxton
- Jiangtao Xu
- JungChak Ahn
- John Flynn
- Toshihiko Noda
- Arnaud Peizerat
- Matthew DuVall
- Wei Tang
- Glenn H. Chapman
- Keiichiro Kagawa
- Keita Yasutomi
- Thomas Sikora
- Taishi Takasawa
- Fabrice Guellec
- Glenn Van Wallendael
- Ricardo Carmona-Galán
- Lorenzo Gonzo
- Lucio Pancheri
- Ruben Verhack
- Shigetaka Kasuga
- Yeong Min Jang
- Kaiming Nie
- Peter Lambert
- Gilles Sicard
- Christine Guillemot
- Kyungho Lee
Venues
- CoRR
- Sensors
- ISSCC
- IEEE J. Solid State Circuits
- ISCAS
- ESSCIRC
- IMSE
- ICME
- Digital Photography
- ICIP
- CVPR Workshops
- Pattern Recognit.
- IEEE Access
- IEEE Trans. Circuits Syst. I Regul. Pap.
- ICASSP
- ICRA
- VLSI Circuits
- Sensors, Cameras, and Systems for Industrial and Scientific Applications
- IEICE Electron. Express
- IEEE Trans. Circuits Syst. Video Technol.
- J. Vis. Commun. Image Represent.
- IEEE SENSORS
- DFT
- PCS
- CVPR
- CVPR (2)
- IEEE Trans. Pattern Anal. Mach. Intell.
- BioCAS
- ICIP (1)
- PICS
- ICTC
- Vis. Comput.
- ICCE-TW
- APSIPA
- Pattern Recognit. Lett.
- 3DV
- IEEE Trans. Consumer Electron.
- Imaging Sensors and Systems
- Microelectron. J.
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