POWER LOSSES
Experts
- Massoud Pedram
- Sachin S. Sapatnekar
- Vivek De
- Massimo Alioto
- Taewhan Kim
- Ricardo Martins
- Saibal Mukhopadhyay
- Nuno Horta
- Yici Cai
- David Z. Pan
- Nuno Lourenço
- Cheng-Kok Koh
- Majid Sarrafzadeh
- Miodrag Potkonjak
- Shih-Chieh Chang
- N. Ranganathan
- Arvind Singh
- Nagarajan Ranganathan
- Xianlong Hong
- Enrico Macii
- Takayasu Sakurai
- Hidetoshi Onodera
- Huei Peng
- Yao-Wen Chang
- Maurizio Paschero
- Monodeep Kar
- Malgorzata Marek-Sadowska
- Jason Cong
- Petru Eles
- Juho Kim
- Josep M. Guerrero
- Frede Blaabjerg
- Sheldon X.-D. Tan
- Lawrence Cohen
- Antonello Rizzi
- Kashem M. Muttaqi
- Benton H. Calhoun
- Gang Qu
- Eby G. Friedman
Venues
- IEEE Trans. Ind. Electron.
- IEEE Access
- IECON
- CoRR
- ISCAS
- IEEE Trans. Instrum. Meas.
- IEEE Trans. Very Large Scale Integr. Syst.
- IEEE Trans. Smart Grid
- IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
- DAC
- IEEE J. Solid State Circuits
- DATE
- ICCAD
- IEEE Trans. Circuits Syst. II Express Briefs
- ISLPED
- IAS
- ICECS
- VLSI Design
- ISQED
- Microelectron. Reliab.
- MWSCAS
- Microelectron. J.
- ISSCC
- ASP-DAC
- J. Circuits Syst. Comput.
- ACM Great Lakes Symposium on VLSI
- CICC
- Int. J. Circuit Theory Appl.
- ICCD
- Sensors
- IEICE Electron. Express
- IEEE Trans. Veh. Technol.
- ISIE
- ACM Trans. Design Autom. Electr. Syst.
- Integr.
- CDC
- IRPS
- SBCCI
- ESSCIRC
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