PHOTOMETRIC INFORMATION
Experts
- Aly A. Farag
- Hongdong Li
- Ryszard Kozera
- Andrew Blake
- Alessio Del Bue
- Junxuan Li
- Roberto Cipolla
- Raj Rao Nadakuditi
- Roberto Mecca
- Yasuyuki Matsushita
- Osamu Ikeda
- Alfred M. Bruckstein
- Jean-Denis Durou
- Michael Breuß
- Mario Castelán
- Brian E. Moore
- Edwin R. Hancock
- Alexander N. Prokopenya
- Lewis Baker
- Takafumi Iwaguchi
- Stan Birchfield
- Martin Weber
- Adrien Bartoli
- Shireen Y. Elhabian
- Jonathan Ventura
- Ruibin Ma
- Tae-Kyun Kim
- Hiroshi Kawasaki
- Lyndon N. Smith
- Richard Szeliski
- Koichiro Deguchi
- Hans-Peter Seidel
- Huai-Yu Wu
- Yukitoshi Watanabe
- Stefanie Zollmann
- Steven W. Zucker
- Krisada Chaiyasarn
- Maxime Lhuillier
- Shuda Yu
Venues
- CoRR
- CVPR
- ICIP
- ICCV
- Image Vis. Comput.
- IEEE Trans. Pattern Anal. Mach. Intell.
- BMVC
- IROS
- Remote. Sens.
- Pattern Recognit. Lett.
- ICPR
- Int. J. Comput. Vis.
- Pattern Recognit.
- CVPR Workshops
- Comput. Aided Geom. Des.
- J. Comput. Civ. Eng.
- Program. Comput. Softw.
- Multim. Tools Appl.
- ICCVG
- ACM Trans. Graph.
- SIBGRAPI
- J. Vis. Commun. Image Represent.
- ACCV (4)
- IEEE Trans. Image Process.
- IEEE Access
- Mach. Vis. Appl.
- VR
- GMP
- MVA
- ECCV (2)
- Int. J. Pattern Recognit. Artif. Intell.
- Pattern Anal. Appl.
- ICNC (5)
- ECCV (1)
- ICML
- FUSION
- AVSS
- ICPRAM
- ICAIIC
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