OUTLIER REMOVAL
Experts
- Tat-Jun Chin
- Hans-Peter Seidel
- Nina Amenta
- Anders P. Eriksson
- Michael Goesele
- Stefano Tubaro
- Jian Dong
- David Suter
- Daniele Panozzo
- Hugues Hoppe
- Falai Chen
- Cláudio T. Silva
- Joachim Giesen
- Álvaro Parra Bustos
- Fredrik Kahl
- Jiri Matas
- Alexander G. Belyaev
- Augusto Sarti
- Uriel López
- Daniel Cohen-Or
- Victor Adrian Prisacariu
- Fabio Antonacci
- Linlin Ge
- Marshall W. Bern
- Demetri Terzopoulos
- Alec Jacobson
- Fan Zhou
- Jieqing Feng
- Y. Narahari
- Silvia Sellán
- Jos B. T. M. Roerdink
- Cheng Lin
- Xiaoxiao Long
- Rendong Ying
- Xiaohui Xie
- Alessia Pini
- Jonathan R. Polimeni
- Victor M. Calo
- Lihua You
Venues
- CoRR
- CVPR
- Comput. Graph. Forum
- ICCV
- ICRA
- IEEE Trans. Pattern Anal. Mach. Intell.
- Comput. Aided Des.
- IEEE Access
- ICASSP
- ACM Trans. Graph.
- Sensors
- Vis. Comput.
- ICIP
- AAAI
- Inf. Sci.
- IEEE Trans. Vis. Comput. Graph.
- SCG
- Comput. Aided Geom. Des.
- 3DV
- Comput. Vis. Graph. Image Process.
- Comput. Graph.
- Commun. Stat. Simul. Comput.
- Int. J. Mach. Learn. Cybern.
- DAGM-Symposium
- ICLR
- Remote. Sens.
- J. Electronic Imaging
- IEICE Trans. Inf. Syst.
- NeuroImage
- Pattern Recognit. Lett.
- MVA
- Multim. Tools Appl.
- Shape Modeling International
- 3DPVT
- CVPR (1)
- SIBGRAPI
- SIGGRAPH
- CCCG
- VISAPP (2)
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