MULTIPLE LIGHT SOURCES
Experts
- Paul E. Debevec
- Edwin R. Hancock
- Takashi Matsuyama
- Eiji Oki
- Hiroyuki Ukida
- Philip L. Worthington
- Jong-Ok Kim
- Luc Van Gool
- Motoharu Matsuura
- Ian T. Foster
- Yuji Iwahori
- Tetsuya Miki
- Yueping Cai
- Takahiko Horiuchi
- Pieter Peers
- Pauli Fält
- Naoto Kishi
- Shoji Tominaga
- Katsushi Ikeuchi
- Rajkumar Kettimuthu
- Ko Nishino
- Marko Subasic
- Atsuto Maki
- Abhijeet Ghosh
- Markku Hauta-Kasari
- Michael Breuß
- Keita Hirai
- Rama Chellappa
- Michael S. Langer
- Mateu Sbert
- Tekin Bicer
- Stamatios Georgoulis
- Sven Loncaric
- Toshikazu Wada
- Shigeki Nakauchi
- Eugene Fiume
- Jun-Sang Yoo
- Daniel Pak-Kong Lun
- S. Y. Yeung
Venues
- CoRR
- IEEE Trans. Pattern Anal. Mach. Intell.
- CVPR
- OFC
- Sensors
- CIC
- ICCV
- IEICE Electron. Express
- ICPR
- IEEE Access
- Comput. Graph. Forum
- Color Imaging Conference
- IEICE Trans. Electron.
- Comput. Vis. Image Underst.
- ICIP
- ICRA
- SIGGRAPH Talks
- Comput. Graph.
- EMBC
- Int. J. Comput. Vis.
- Displays
- BMVC
- ACM Trans. Graph.
- ICPR (1)
- IEEE Trans. Instrum. Meas.
- I2MTC
- Entropy
- CGIV/MCS
- Pattern Recognit.
- CGIV
- Systems and Computers in Japan
- PICS
- Neural Networks
- MVA
- SIGGRAPH Posters
- SMC
- Rendering Techniques
- Remote. Sens.
- CVCS
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