MULTIPLE LIGHT SOURCES
Experts
- Paul E. Debevec
- Edwin R. Hancock
- Hiroyuki Ukida
- Takashi Matsuyama
- Eiji Oki
- Philip L. Worthington
- Yueping Cai
- Tetsuya Miki
- Takahiko Horiuchi
- Naoto Kishi
- Pieter Peers
- Katsushi Ikeuchi
- Motoharu Matsuura
- Shoji Tominaga
- Jong-Ok Kim
- Luc Van Gool
- Yuji Iwahori
- Pauli Fält
- Ian T. Foster
- Markku Hauta-Kasari
- Marko Subasic
- Stamatios Georgoulis
- Ko Nishino
- Michael Breuß
- Shigeki Nakauchi
- Michael S. Langer
- Mateu Sbert
- Atsuto Maki
- Rama Chellappa
- Jun-Sang Yoo
- Eugene Fiume
- Rajkumar Kettimuthu
- Tekin Bicer
- Toshikazu Wada
- Abhijeet Ghosh
- Sven Loncaric
- Keita Hirai
- Patrice Hirtzlin
- Toshimitsu Tanaka
Venues
- CoRR
- IEEE Trans. Pattern Anal. Mach. Intell.
- CVPR
- OFC
- CIC
- Sensors
- IEEE Access
- IEICE Electron. Express
- ICCV
- ICPR
- Comput. Graph. Forum
- Color Imaging Conference
- IEICE Trans. Electron.
- ICRA
- Comput. Vis. Image Underst.
- ICIP
- ACM Trans. Graph.
- SIGGRAPH Talks
- Int. J. Comput. Vis.
- BMVC
- Comput. Graph.
- EMBC
- Displays
- IEEE Trans. Instrum. Meas.
- ICPR (1)
- I2MTC
- Remote. Sens.
- Rendering Techniques
- Entropy
- CGIV/MCS
- Neural Networks
- Pattern Recognit.
- Systems and Computers in Japan
- CGIV
- SMC
- SIGGRAPH Posters
- PICS
- MVA
- PG
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