MINIMUM DESCRIPTION LENGTH CRITERION
Experts
- Melvyn L. Smith
- Ping Tan
- Lyndon N. Smith
- Yasuyuki Matsushita
- In So Kweon
- Joon-Young Lee
- Satoshi Ikehata
- Boxin Shi
- Jiyoung Jung
- Gule Saman
- Roberto Mecca
- Jean-Denis Durou
- Chi-Keung Tang
- Alexander Berenstein
- Kousik Maiti
- Sudipta N. Sinha
- Alex C. Kot
- Jinsong Zhang
- Yiming Jia
- Haoyu Chen
- Roberto Cipolla
- Long Quan
- Xudong Jiang
- David W. Jacobs
- Daniel Lichy
- Felicja Okulicka-Dluzewska
- Ryszard Kozera
- Guoying Zhao
- Soumyadip Sengupta
- Stéphane Pateux
- Lyle Noakes
- Jean-François Lalonde
- Edwin R. Hancock
- Yvain Quéau
- Zitong Yu
- Suchandan Kayal
- Qian Zheng
- Delphine Le Guen
- Jiuai Sun
Venues
- CoRR
- CVPR
- Commun. Stat. Simul. Comput.
- ICCV
- Sensors
- Int. J. Comput. Vis.
- BMVC
- IEEE Trans. Pattern Anal. Mach. Intell.
- Entropy
- Discret. Math.
- J. Intell. Fuzzy Syst.
- Pattern Recognit. Lett.
- ICCP
- ICPR
- ICASSP
- 3DV
- Technometrics
- MVA
- CCCG
- Symmetry
- Image Vis. Comput.
- Arch. Math. Log.
- ICIP
- J. Multivar. Anal.
- IEEE Trans. Circuits Syst. Video Technol.
- Pattern Anal. Appl.
- Comput. Stat. Data Anal.
- ECCV (4)
- IEEE Geosci. Remote. Sens. Lett.
- Found. Comput. Math.
- ICIP (1)
- Recent Issues in Pattern Analysis and Recognition
- ICRA
- Comput. Aided Des.
- Remote. Sens.
- Complex.
- SIAM J. Imaging Sci.
- Found. Trends Comput. Graph. Vis.
- ACIVS
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