MINIMUM DESCRIPTION LENGTH CRITERION
Experts
- Melvyn L. Smith
- Lyndon N. Smith
- Yasuyuki Matsushita
- Ping Tan
- In So Kweon
- Boxin Shi
- Satoshi Ikehata
- Jiyoung Jung
- Joon-Young Lee
- Gule Saman
- Roberto Mecca
- Jiuai Sun
- Xudong Jiang
- Michael Goesele
- Nicu Sebe
- Jean-François Lalonde
- Edwin R. Hancock
- Paulo F. U. Gotardo
- Abdul R. Farooq
- Jean-Denis Durou
- Delphine Le Guen
- Qian Zheng
- Alex C. Kot
- Zitong Yu
- Soumyadip Sengupta
- Heng Guo
- Stéphane Pateux
- Tai-Pang Wu
- James J. Clark
- Hao Tang
- Yvain Quéau
- Yiming Jia
- Sudipta N. Sinha
- Kousik Maiti
- Ryszard Kozera
- Long Quan
- Guoying Zhao
- Jinsong Zhang
- Jens Ackermann
Venues
- CoRR
- CVPR
- Commun. Stat. Simul. Comput.
- ICCV
- IEEE Trans. Pattern Anal. Mach. Intell.
- Sensors
- BMVC
- Entropy
- Int. J. Comput. Vis.
- Pattern Recognit. Lett.
- Technometrics
- Discret. Math.
- 3DV
- Image Vis. Comput.
- J. Multivar. Anal.
- ICCP
- Arch. Math. Log.
- J. Intell. Fuzzy Syst.
- ICIP
- ICASSP
- CCCG
- MVA
- Symmetry
- ICPR
- ECCV (3)
- CRV
- Graph. Model.
- Found. Trends Comput. Graph. Vis.
- IEEE Trans. Image Process.
- ECCV (4)
- HAPTICS
- Ann. Pure Appl. Log.
- Des. Codes Cryptogr.
- EUROCRYPT
- ECCV (2)
- Pattern Anal. Appl.
- SIGGRAPH Sketches
- SCG
- IEEE Computer Graphics and Applications
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