MIDDLE LAYER
Experts
- P. T. Lai
- Kwang-Baek Kim
- Tsuneki Yamasaki
- Ryosuke Ozaki
- Steven J. E. Wilton
- X. D. Huang
- Nitul Dutta
- Assem A. M. Bsoul
- Kai-Yuan Chao
- Wojciech Samek
- Jin-Soo Kim
- Ying Hou
- Di He
- Larry D. Pyeatt
- João P. P. Gomes
- Tae-Hun Kim
- Quan Wang
- Yunchang Yang
- Kangho Kim
- Chuanxia Zheng
- Lingqiao Liu
- Deniz Erdogmus
- Kai Ouyang
- Yongluan Zhou
- Johnny K. O. Sin
- Sungwoong Kim
- Tom Mahler
- Alphan Sahin
- Anton van den Hengel
- Erez Shalom
- Wayne Luk
- Sung-In Jung
- Michael Kaufmann
- Boris Düdder
- Yifei Zhu
- Shuxin Zheng
- Toshihiro Furukawa
- Tie-Yan Liu
- Chen Xing
Venues
- CoRR
- Microelectron. Reliab.
- Sensors
- IEEE Access
- IEICE Trans. Electron.
- IJCNN
- IEICE Electron. Express
- Neurocomputing
- NEMS
- Displays
- IGARSS
- SMC
- Neural Process. Lett.
- IEEE Commun. Mag.
- RFC
- J. Vis.
- Wirel. Pers. Commun.
- ACC
- IEEE Trans. Computers
- IEEE SENSORS
- Remote. Sens.
- DAC
- Multim. Tools Appl.
- IACR Cryptol. ePrint Arch.
- Comput. Math. Appl.
- J. King Saud Univ. Comput. Inf. Sci.
- ICCAD
- Eur. J. Comb.
- IEEE Trans. Geosci. Remote. Sens.
- ICS
- Comput. Electron. Agric.
- IEEE Trans Autom. Sci. Eng.
- Neural Networks
- ICASSP
- Microelectron. J.
- Multim. Syst.
- Appl. Math. Comput.
- APWeb
- ISCAS
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