MAJORITY CLASS
Experts
- Nitesh V. Chawla
- Roberto Alejo
- Francisco Herrera
- Jerzy Stefanowski
- Bartosz Krawczyk
- Swagatam Das
- Vicente García
- Taghi M. Khoshgoftaar
- José Martínez Sotoca
- Saptarshi Bej
- Olaf Wolkenhauer
- Alberto Fernández
- Markus Wolfien
- Dariusz Brzezinski
- Grigorios Tsoumakas
- Ruixuan Wang
- María Pérez-Ortiz
- Ramón Alberto Mollineda
- Krystyna Napierala
- Bin Liu
- Xiang Li
- Kelwin Fernandes
- José Salvador Sánchez
- Jian Wang
- Krung Sinapiromsaran
- Colin Bellinger
- Rosa Maria Valdovinos
- Shounak Datta
- Michal Koziarski
- Kevin W. Bowyer
- Nathalie Japkowicz
- Lawrence O. Hall
- Sankha Subhra Mullick
- Georgia D. Tourassi
- Jaime S. Cardoso
- Debashree Devi
- Anjana Gosain
- Joaquim F. Pinto da Costa
- Wing W. Y. Ng
Venues
- CoRR
- IEEE Access
- Expert Syst. Appl.
- IJCNN
- Knowl. Based Syst.
- IEEE Trans. Knowl. Data Eng.
- Inf. Sci.
- Appl. Intell.
- Neurocomputing
- ICDM
- Concurr. Comput. Pract. Exp.
- ICMLA
- Pattern Recognit.
- Knowl. Inf. Syst.
- BMVC
- IEEE Trans. Instrum. Meas.
- Multim. Tools Appl.
- PAKDD (2)
- Pattern Recognit. Lett.
- DS
- Eng. Appl. Artif. Intell.
- Appl. Soft Comput.
- Pattern Anal. Appl.
- Inf.
- ICCA
- CIDM
- ISPA/BDCloud/SocialCom/SustainCom
- Sensors
- ICDM (Workshops)
- EMBC
- BMC Bioinform.
- SMC
- Artif. Intell. Rev.
- PAKDD (1)
- ICASSP
- IEEE J. Sel. Top. Appl. Earth Obs. Remote. Sens.
- IEEE Trans. Neural Networks Learn. Syst.
- CIARP
- KDD
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