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Experts
- Liang Shi
- Dario Farina
- Boris Bellalta
- Mingxing Zhu
- Guanglin Li
- Shixiong Chen
- Andreas Hierlemann
- Yina Lv
- Sergio Barrachina-Muñoz
- Francesc Wilhelmi
- Ales Holobar
- Urs Frey
- Emin Martinian
- Weisheng Zhao
- Brian M. Kurkoski
- Lorenzo Bruzzone
- Joseph Jean Boutros
- Luca Berdondini
- Martin J. Wainwright
- John J. Foxe
- Gilles Zémor
- Shifei Ding
- Meir Feder
- Javier Garcia-Frías
- Satoshi Suyama
- Yukihiko Okumura
- Xin Wang
- Zijian Yang
- Longfei Luo
- Hiroyuki Seki
- Xun Chen
- Jun Mashino
- Claudia Paris
- Jong-Tae Park
- Kaushik Roy
- Benjamín Iñíguez
- Changlong Li
- Tatsuki Okuyama
- C. A. Dimitriadis
Venues
- CoRR
- EMBC
- Sensors
- Microelectron. Reliab.
- IEEE Access
- OFC
- J. Comput. Chem.
- NeuroImage
- Remote. Sens.
- NEMS
- IEEE J. Solid State Circuits
- Microelectron. J.
- IEICE Trans. Electron.
- IEEE Trans. Biomed. Eng.
- J. Comput. Phys.
- ISCAS
- 3DIC
- IEEE Trans. Instrum. Meas.
- IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
- Comput. Phys. Commun.
- ISIT
- ITC
- ISSCC
- IGARSS
- DAC
- IEEE Trans. Inf. Theory
- PLoS Comput. Biol.
- GLOBECOM
- Bioinform.
- NER
- DATE
- Entropy
- Proc. IEEE
- ICCAD
- ICC
- IEEE Trans. Commun.
- Symmetry
- Discret. Math.
- IEEE Trans. Very Large Scale Integr. Syst.
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