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Experts
- Yeong Min Jang
- P. M. Nabeel
- Jayaraj Joseph
- Mohanasankar Sivaprakasam
- Gordon Wetzstein
- Meng He
- Yueping Cai
- Zhenbo Deng
- Markus Axer
- Mostafa Zaman Chowdhury
- Zabih Ghassemlooy
- Md. Tanvir Hossan
- Eiji Oki
- Stanislav Zvanovec
- Denghui Xu
- M. Salman Asif
- J. Ian Munro
- Wenyi Zhang
- Ashok Veeraraghavan
- Tetsuya Miki
- Yusuke Kozawa
- Hao Chen
- Paul E. Debevec
- Wolfgang Heidrich
- Zhichao Tan
- Naoto Kishi
- Yi Zhao
- Bryce Sandlund
- Srinivasa G. Narasimhan
- Katrin Amunts
- Bailang Yu
- Steve Hranilovic
- Jingying Hou
- Hoa Le Minh
- Yu-Hsuan Lin
- Andrea Baschirotto
- Mithun Kuniyil Ajith Singh
- Chris Van Hoof
- Shiyong Liu
Venues
- Sensors
- IEEE Trans. Instrum. Meas.
- CoRR
- IEEE Access
- Displays
- EMBC
- OFC
- IEEE J. Solid State Circuits
- Color Imaging Conference
- ISCAS
- IGARSS
- Microelectron. J.
- Microelectron. Reliab.
- IEICE Trans. Electron.
- Remote. Sens.
- I2MTC
- IEEE Trans. Medical Imaging
- ISSCC
- ISBI
- IEICE Electron. Express
- IEEE Trans. Ind. Electron.
- ECOC
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- Proc. IEEE
- IEEE Trans. Biomed. Eng.
- CIC
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- ACM Trans. Graph.
- ICIP
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- IEEE Trans. Circuits Syst. II Express Briefs
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