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Experts
- Yeong Min Jang
- Mohanasankar Sivaprakasam
- P. M. Nabeel
- Jayaraj Joseph
- Gordon Wetzstein
- Meng He
- Zhenbo Deng
- Md. Tanvir Hossan
- Mostafa Zaman Chowdhury
- Yueping Cai
- Zabih Ghassemlooy
- Markus Axer
- J. Ian Munro
- Stanislav Zvanovec
- Denghui Xu
- Eiji Oki
- M. Salman Asif
- Oliver Bimber
- Paul E. Debevec
- Moh. Khalid Hasan
- Andrea Baschirotto
- Steve Hranilovic
- Yi Zhao
- Naoto Kishi
- Shree K. Nayar
- Jussi Parkkinen
- Alexander Plopski
- Jingying Hou
- Mithun Kuniyil Ajith Singh
- Angelo Nagari
- Wolfgang Heidrich
- Nam Tuan Le
- Yusuke Kozawa
- Chien-Hung Yeh
- Ashok Veeraraghavan
- Zhichao Tan
- Chi-Wai Chow
- Bryce Sandlund
- Yang Liu
Venues
- Sensors
- IEEE Trans. Instrum. Meas.
- CoRR
- IEEE Access
- Displays
- EMBC
- OFC
- IEEE J. Solid State Circuits
- Color Imaging Conference
- ISCAS
- IGARSS
- Microelectron. J.
- Microelectron. Reliab.
- IEICE Trans. Electron.
- Remote. Sens.
- I2MTC
- IEEE Trans. Medical Imaging
- ISSCC
- ISBI
- Proc. IEEE
- CIC
- IEEE Trans. Biomed. Eng.
- IEICE Electron. Express
- ICTON
- ECOC
- IEEE Trans. Ind. Electron.
- IAS
- ESSCIRC
- ICECS
- IEEE SENSORS
- GLOBECOM
- ACM Trans. Graph.
- ICRA
- ICIP
- NEMS
- IEEE Trans. Circuits Syst. II Express Briefs
- CICC
- J. Vis.
- IEEE Commun. Lett.
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