LEAKAGE CURRENT
Experts
- Ming-Dou Ker
- David T. Blaauw
- Dennis Sylvester
- Vivek De
- Volkan Kursun
- Kaushik Roy
- Kevin Zhang
- James W. Tschanz
- Takayasu Sakurai
- Ching-Te Chuang
- Fatih Hamzaoglu
- Rajiv V. Joshi
- Yih Wang
- Benton H. Calhoun
- Gérard Ghibaudo
- Saibal Mukhopadhyay
- Chris H. Kim
- Uddalak Bhattacharya
- Anantha P. Chandrakasan
- Koji Nii
- Shun'ichiro Ohmi
- Seong-Ook Jung
- Amara Amara
- Hei Wong
- Amit Agarwal
- Hung-Jen Liao
- Manoj Sachdev
- Mark A. Anders
- Taejoong Song
- Jonathan Chang
- Yong-Gee Ng
- Bastien Giraud
- Steven Hsu
- Hiroshi Iwai
- Himanshu Kaul
- Kuniyuki Kakushima
- Krishnan Ravichandran
- Tetsuya Hirose
- Kiyoshi Kato
Venues
- Microelectron. Reliab.
- IEEE J. Solid State Circuits
- Microelectron. J.
- ISCAS
- IRPS
- ISSCC
- IEEE Access
- IEICE Trans. Electron.
- IEEE Trans. Very Large Scale Integr. Syst.
- IEEE Trans. Ind. Electron.
- ICECS
- CICC
- IEEE Trans. Circuits Syst. II Express Briefs
- VLSI Design
- Sensors
- ISQED
- ESSCIRC
- IEICE Electron. Express
- ESSDERC
- MWSCAS
- SoCC
- DRC
- NEMS
- J. Circuits Syst. Comput.
- CCE
- IEEE Trans. Circuits Syst. I Regul. Pap.
- CoRR
- J. Low Power Electron.
- VLSI Circuits
- ICICDT
- OFC
- IEEE Trans. Instrum. Meas.
- ITC
- ISLPED
- VLSI Technology and Circuits
- IECON
- VDAT
- ICCD
- IET Circuits Devices Syst.
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