IRIS RECOGNITION SYSTEMS
Experts
- Adam Czajka
- Kevin W. Bowyer
- Mateusz Trokielewicz
- Zhenan Sun
- Patrick J. Flynn
- Tieniu Tan
- Piotr Maciejewicz
- Andreas Uhl
- Konstantinos Sirlantzis
- Fernando Alonso-Fernandez
- Mahmut Karakaya
- Kang Ryoung Park
- Gareth Howells
- Zhaofeng He
- Hugo Proença
- Byungjun Son
- Yillbyung Lee
- Arun Ross
- Man Zhang
- Yingzi Du
- Daniel Moreira
- Kaushik Roy
- Prabir Bhattacharya
- Nicolaie Popescu-Bodorin
- Richard P. Wildes
- James R. Matey
- Craig Belcher
- Petru Radu
- Amanda Sgroi
- Soumyadip Rakshit
- Estefan Ortiz
- Maria De Marsico
- Josef Bigün
- John Daugman
- Farzin Deravi
- Yang Hu
- Sanaul Hoque
- Hector J. Santos-Villalobos
- Eduardo José da S. Luz
Venues
- CoRR
- IEEE Trans. Inf. Forensics Secur.
- ICB
- Pattern Recognit. Lett.
- ICIP
- ICPR
- BTAS
- IEEE Access
- Multim. Tools Appl.
- Image Vis. Comput.
- IET Biom.
- IJCB
- BIOSIG
- IEEE Trans. Pattern Anal. Mach. Intell.
- WACV
- Comput. Vis. Image Underst.
- CIB
- Sensors
- Int. J. Biom.
- ICWET
- AVBPA
- BIOSIGNALS
- SITIS
- CCBR
- Proc. IEEE
- CIARP
- ICARCV
- IWBF
- Pattern Recognit.
- ISBA
- EUSIPCO
- Symmetry
- ACPR
- WACV (Workshops)
- SOFA (2)
- IIH-MSP
- EST
- SINOBIOMETRICS
- J. Electronic Imaging
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