INTENSITY PROFILE
Experts
- Jovisa D. Zunic
- Ji Zhao
- Yuji Iwahori
- Yunmei Chen
- Xiaowu Chen
- Robert J. Woodham
- Nasir M. Rajpoot
- Brian H. Do
- Xuequan Lu
- Hervé Delingette
- Xiaoling Wu
- Zhongke Wu
- Junmo Kim
- David Clifford Wilson
- Sofia Simon-Trench
- Abhinav Dhall
- Xingjie Wei
- Paul L. Rosin
- Manas Kamal Bhuyan
- John D. Musa
- Daniel Preotiuc-Pietro
- Wei Teng
- Jian-Gang Wang
- Donggyu Joo
- Nikolas Herbst
- Jia Li
- Lyle H. Ungar
- Sharath Chandra Guntuku
- Kenji Funahashi
- Edward A. Geiser
- Johannes C. Eichstaedt
- Weizhou Liu
- Jóakim von Kistowski
- Yangyan Li
- Steven W. Zucker
- Allison M. Okamura
- Jim Kong
- Yu Zhang
- François Chung
Venues
- CoRR
- IEEE Access
- Sensors
- Pattern Recognit.
- IEEE Trans. Geosci. Remote. Sens.
- Int. J. Geogr. Inf. Sci.
- IEEE Trans. Image Process.
- ACM Trans. Graph.
- Pattern Recognit. Lett.
- Discret. Math.
- ICASSP
- Comput. Geosci.
- SHAPES
- ISBI
- ICTON
- Appl. Math. Comput.
- Inf. Sci.
- CVPR
- ICRA
- SIAM J. Appl. Math.
- IGARSS
- ICIP
- NIPS
- SIAM J. Imaging Sci.
- Int. J. Comput. Vis.
- SIBGRAPI
- NEMS
- Quantum Inf. Process.
- Int. J. Pattern Recognit. Artif. Intell.
- Image Process. Line
- IEEE Trans. Medical Imaging
- IEEE Trans. Haptics
- Entropy
- KES
- Comput. Phys. Commun.
- Image Vis. Comput.
- ICCV
- MICCAI (2)
- J. Math. Imaging Vis.
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