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Experts
- Yaoyao Ye
- Paola Saccomandi
- Jun Ye
- Meint K. Smit
- Said Nacer
- Dean Lewis
- Xiaoxiong Xiong
- B. El Jani
- Qinghua Guo
- Jing Zhou
- Kei Kaneko
- Ahmed Rebey
- Mohamed Henini
- Richard Schatz
- Rei Hashimoto
- Yuxi Ruan
- Juin J. Liou
- Hirotaka Tanimura
- Xiaomin Ren
- Philippe Perdu
- Weihua Guo
- Shigeyuki Takagi
- Abdelkader Aissat
- Hisataka Maruyama
- Yongqing Huang
- A. F. G. Monte
- Christian Boit
- Hichem Maaref
- Xiang Liu
- Jiangtao Xi
- Shinji Saito
- Jiann-Shiun Yuan
- Fumihito Arai
- Felix Beaudoin
- Krzysztof Górecki
- Hui Huang
- Romain Desplats
- Antonio Núñez
- Yanguang Yu
Venues
- Microelectron. J.
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- Sensors
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- IEEE Trans. Instrum. Meas.
- IEEE J. Solid State Circuits
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- IEEE J. Sel. Areas Commun.
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- IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
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- Int. J. Bifurc. Chaos
- DATE
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- IRPS
- J. Vis.
- IEEE Trans. Biomed. Eng.
- OECC/PSC
- Int. J. Autom. Technol.
- ICCAD
- IEEE Trans. Very Large Scale Integr. Syst.
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