HIGHLY DISCRIMINATIVE
Experts
- Li Liu
- Paul W. Fieguth
- Yongsheng Dong
- Bhabatosh Chanda
- Matti Pietikäinen
- Ling-Yu Duan
- Wen Gao
- Bidyut B. Chaudhuri
- Swalpa Kumar Roy
- Francesco Bianconi
- Dipak Kumar Ghosh
- Antonio Fernández
- Alain Trémeau
- André Ricardo Backes
- Lintao Zheng
- Shiv Ram Dubey
- Odemir Martinez Bruno
- David M. Chen
- Jinwen Ma
- Damien Muselet
- Bernd Girod
- Yuwei Wu
- Tiejun Huang
- Alice Porebski
- Vijay Chandrasekhar
- Jiexin Pu
- Youssef El Merabet
- Chen Chen
- Shutao Li
- Nicolas Vandenbroucke
- Yo Horikawa
- Rouzbeh Maani
- Yassine Ruichek
- Sanjay Kalra
- Sam S. Tsai
- Jie Chen
- Yen-Yu Lin
- Issam El Khadiri
- Jarbas Joaci de Mesquita Sá Junior
Venues
- CoRR
- ICIP
- Pattern Recognit.
- Pattern Recognit. Lett.
- Multim. Tools Appl.
- IEEE Access
- ICASSP
- Sensors
- CVPR
- ICPR
- INTERSPEECH
- IEEE Trans. Image Process.
- IEEE Trans. Pattern Anal. Mach. Intell.
- J. Electronic Imaging
- Vis. Comput.
- IGARSS
- Expert Syst. Appl.
- Neurocomputing
- Remote. Sens.
- BMVC
- IROS
- Image Vis. Comput.
- ACM Multimedia
- Int. J. Pattern Recognit. Artif. Intell.
- Eng. Appl. Artif. Intell.
- ICIAR
- ICDAR
- EMBC
- J. Vis. Commun. Image Represent.
- Bioinform.
- MVA
- SIU
- IEEE Geosci. Remote. Sens. Lett.
- IEEE Signal Process. Lett.
- IEEE Trans. Multim.
- CVPR Workshops
- IEEE Trans. Geosci. Remote. Sens.
- WACV
- ICCV
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