HIGHLY DISCRIMINATIVE
Experts
- Li Liu
- Paul W. Fieguth
- Matti Pietikäinen
- Bhabatosh Chanda
- Yongsheng Dong
- Bidyut B. Chaudhuri
- Swalpa Kumar Roy
- Wen Gao
- Ling-Yu Duan
- Francesco Bianconi
- Dipak Kumar Ghosh
- Shiv Ram Dubey
- Alain Trémeau
- André Ricardo Backes
- Damien Muselet
- Antonio Fernández
- David M. Chen
- Odemir Martinez Bruno
- Jinwen Ma
- Lintao Zheng
- Chen Chen
- Sanjay Kalra
- Tiejun Huang
- Chih-Cheng Hung
- Jie Chen
- Youssef El Merabet
- Jarbas Joaci de Mesquita Sá Junior
- Sam S. Tsai
- Jie Lin
- Bernd Girod
- Yuwei Wu
- Elena González
- Barbara Hammer
- Yen-Yu Lin
- Alice Porebski
- Rouzbeh Maani
- Brian C. Lovell
- Issam El Khadiri
- Radek Grzeszczuk
Venues
- CoRR
- ICIP
- Pattern Recognit.
- Pattern Recognit. Lett.
- IEEE Access
- Multim. Tools Appl.
- ICASSP
- Sensors
- CVPR
- INTERSPEECH
- IEEE Trans. Image Process.
- ICPR
- IEEE Trans. Pattern Anal. Mach. Intell.
- J. Electronic Imaging
- Vis. Comput.
- IGARSS
- Expert Syst. Appl.
- Neurocomputing
- BMVC
- Remote. Sens.
- ACM Multimedia
- IROS
- Image Vis. Comput.
- Int. J. Pattern Recognit. Artif. Intell.
- EMBC
- ICDAR
- ICIAR
- Eng. Appl. Artif. Intell.
- IEEE Trans. Geosci. Remote. Sens.
- J. Chem. Inf. Comput. Sci.
- MVA
- IEEE Signal Process. Lett.
- IEEE Trans. Multim.
- Inf. Sci.
- PReMI
- ICCV
- IPTA
- SIU
- IEEE Geosci. Remote. Sens. Lett.
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