HIGH DENSITY
Experts
- Onur Mutlu
- Fumihito Arai
- Sung Kyu Lim
- Toshio Fukuda
- Sudeep Pasricha
- Luca Benini
- Hasan Hassan
- Giovanni De Micheli
- Xiaorui Wang
- Shinya Sakuma
- Mahmut T. Kandemir
- Keren Bergman
- Hamid Sarbazi-Azad
- Donghyuk Lee
- Yao-Wen Chang
- David T. Blaauw
- Makoto Nagata
- Jörg Henkel
- Yuan Xie
- Hideharu Amano
- Krishnendu Chakrabarty
- Hannu Tenhunen
- Kaushik Roy
- Gaudenzio Meneghesso
- Masahiro Nakajima
- Takafumi Fukushima
- Dennis Sylvester
- Minesh Patel
- Wei Wang
- Shaolei Ren
- Saugata Ghose
- Mahdi Nikdast
- Xiaowei Li
- Joris Van Campenhout
- Keijiro Suzuki
- Tadahiro Kuroda
- Nam Sung Kim
- Yintang Yang
- Jeremie S. Kim
Venues
- Sensors
- Microelectron. Reliab.
- CoRR
- OFC
- IEEE Access
- IEEE J. Solid State Circuits
- Microelectron. J.
- ISCAS
- NEMS
- IEICE Trans. Electron.
- EMBC
- IEEE Trans. Ind. Electron.
- DAC
- DATE
- ISSCC
- IEEE SENSORS
- IEEE Trans. Instrum. Meas.
- IEICE Electron. Express
- ICTON
- IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
- IEEE Trans. Very Large Scale Integr. Syst.
- CICC
- Proc. IEEE
- IBM J. Res. Dev.
- ECOC
- IEEE Trans. Circuits Syst. II Express Briefs
- IECON
- ITC
- IRPS
- 3DIC
- IEEE Trans. Computers
- ICCD
- IEEE Trans. Circuits Syst. I Regul. Pap.
- ICECS
- IEEE Micro
- ICCAD
- ESSCIRC
- ASP-DAC
- ESSDERC
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