FUNCTIONAL VERIFICATION
Experts
- Rolf Drechsler
- Sofiène Tahar
- Masahiro Fujita
- Jacob A. Abraham
- Magdy S. Abadir
- Matteo Sonza Reorda
- Graziano Pravadelli
- Li-C. Wang
- Franco Fummi
- Daniel Große
- Randal E. Bryant
- Miroslav N. Velev
- Ernesto Sánchez
- Avi Ziv
- Dominique Borrione
- Julien Schmaltz
- Gerhard Schellhorn
- Biplab K. Sikdar
- Maciej J. Ciesielski
- Eduard Cerny
- Mamata Dalui
- Wolfgang Reif
- Carlo A. Furia
- Phillip J. Restle
- Michael Fisher
- Clark W. Barrett
- Sung-Mo Kang
- Giovanni Squillero
- Mohamed Darouach
- Maksim Jenihhin
- Xiaowei Li
- Valeria Bertacco
- Karina R. G. da Silva
- Christian Jacobi
- Görschwin Fey
- Warren A. Hunt Jr.
- Trevor N. Mudge
- Carl Pixley
- Robert Wille
Venues
- CoRR
- DAC
- DATE
- Microprocess. Microsystems
- ICCD
- IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
- IEEE Micro
- ITC
- IEEE J. Solid State Circuits
- VLSI Design
- ASP-DAC
- MTV
- IEEE Trans. Very Large Scale Integr. Syst.
- IEEE Des. Test Comput.
- IEEE Trans. Computers
- ISQED
- Sensors
- ISCAS
- IEEE Access
- IBM J. Res. Dev.
- ICCAD
- HLDVT
- Microelectron. Reliab.
- FMCAD
- DSD
- ISSCC
- IEEE Trans. Ind. Electron.
- CAV
- ISVLSI
- Computer
- ICECS
- MEMOCODE
- ICASSP
- IACR Cryptol. ePrint Arch.
- CICC
- ACM Trans. Design Autom. Electr. Syst.
- ISLPED
- Int. J. Softw. Tools Technol. Transf.
- ASYNC
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