FORESEEABLE FUTURE
Experts
- Zili Shao
- Ken Takeuchi
- Jehoshua Bruck
- Chihiro Matsui
- Arvind
- Dongkun Shin
- Paul H. Siegel
- Eitan Yaakobi
- Alexander Vardy
- Tae-Sun Chung
- Zhaoyan Shen
- Dong-Joo Park
- Chenlin Ma
- Anxiao Jiang
- Yi Wang
- Sang-Won Lee
- Young Ik Eom
- Soojun Im
- Kyu Ho Park
- Donghyun Kang
- Andrea C. Arpaci-Dusseau
- Lei Han
- Biplob K. Debnath
- Sam H. Noh
- Renhai Chen
- Jack K. Wolf
- Onur Mutlu
- Sang Woo Jun
- Remzi H. Arpaci-Dusseau
- Koji Hosono
- David Flynn
- Seung-Ho Lim
- Donald E. Porter
- Takahiro Shimizu
- Toshiki Hisada
- Makoto Miakashi
- Youyou Lu
- Hiroshi Nakamura
- Yee Lih Koh
Venues
- CoRR
- FAST
- IEEE J. Solid State Circuits
- ISSCC
- ISCAS
- Microelectron. Reliab.
- USENIX Annual Technical Conference
- SIGMOD Conference
- SAC
- MSST
- ICCE
- ACM Trans. Storage
- IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
- IEEE Trans. Consumer Electron.
- IEICE Trans. Electron.
- IEEE Trans. Inf. Theory
- IEEE Trans. Computers
- J. Syst. Archit.
- ISCA
- OSDI
- login Usenix Mag.
- ASPLOS
- Proc. IEEE
- Sensors
- DATE
- CLUSTER
- EMSOFT
- Asian Test Symposium
- Proc. VLDB Endow.
- CICC
- HotStorage
- ICCD
- DAC
- IEEE Access
- VLSI Technology and Circuits
- ECCTD
- EuroSys
- iSES
- IEEE Consumer Electron. Mag.
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