FIELD OF SURFACE NORMALS
Experts
- Edwin R. Hancock
- Hossein Ragheb
- Philip L. Worthington
- Fabio Sartori
- Aly A. Farag
- Dawei Yang
- Ryo Kawahara
- Jan Eric Lenssen
- Ko Nishino
- Jonathan Masci
- Christian Osendorfer
- Fan-Hui Kong
- Jianguang Wen
- Michael Breuß
- Satoshi Murai
- Shohei Nobuhara
- Shengbiao Wu
- Qiang Liu
- Jia Deng
- Abdelrehim H. Ahmed
- David T. Neilson
- Chenyu Wu
- Nagesh Basavanhally
- Meng Li
- Aljaz Kramberger
- Joachim Weickert
- Craig Fancourt
- Jan-Michael Frahm
- Stephen Wiggins
- M. Saadatseresht
- Thomas Leichtweis
- Ivan Eichhardt
- Wataru Muraoroshi
- Ping Fu
- Bin Zhong
- Anlun Xu
- Giuseppe Claudio Guarnera
- Solveig Bruvoll
- Dongqing Chen
Venues
- CVPR
- Remote. Sens.
- ICIP (3)
- IGARSS
- CoRR
- IEEE Trans. Pattern Anal. Mach. Intell.
- Pattern Recognit.
- ICNC (5)
- Comput. Geosci.
- ICIP
- ICIP (2)
- IEEE Trans. Image Process.
- Int. J. Comput. Vis.
- ICCV
- Vis. Comput.
- SSPR/SPR
- Pattern Recognit. Lett.
- ICPR
- ACC
- MVA
- Image Vis. Comput.
- SCIA
- Comput. Vis. Graph. Image Process.
- MICCAI
- SSVM
- 3DIMPVT
- 3DV
- ICIP (6)
- SMC
- IICAI
- ICCV Workshops
- HIS (1)
- ECCV Workshops (2)
- TFCV
- Int. J. Comput. Geom. Appl.
- CVGIP Image Underst.
- GMP
- DSP
- Comput. Aided Geom. Des.
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