FIELD OF SURFACE NORMALS
Experts
- Edwin R. Hancock
- Philip L. Worthington
- Hossein Ragheb
- Fabio Sartori
- Jonathan Masci
- Satoshi Murai
- Qiang Liu
- Jia Deng
- Abdelrehim H. Ahmed
- Ryo Kawahara
- Michael Breuß
- Christian Osendorfer
- Ko Nishino
- Fan-Hui Kong
- Aly A. Farag
- Dawei Yang
- Jianguang Wen
- Jan Eric Lenssen
- Shohei Nobuhara
- Shengbiao Wu
- Lichi Zhang
- Dongqing Chen
- Meng Li
- Dong Li
- Izzat Bakhadyrov
- Osamu Ikeda
- Vladimir A. Kovalevsky
- Takayuki Okatani
- Yilin Wang
- Thomas Leichtweis
- Cambron N. Carter
- Darren Cosker
- Leiku Yang
- Andrés Bruhn
- Hanspeter A. Mallot
- Marios M. Patrikoussakis
- Adrian G. Bors
- Christopher G. Atkeson
- Dibyendu Nandy
Venues
- CVPR
- Remote. Sens.
- IGARSS
- CoRR
- ICIP (3)
- Int. J. Comput. Vis.
- IEEE Trans. Pattern Anal. Mach. Intell.
- Pattern Recognit. Lett.
- Comput. Geosci.
- ICPR
- MVA
- ICNC (5)
- ACC
- ICCV
- ICIP
- SSPR/SPR
- Vis. Comput.
- ICIP (2)
- IEEE Trans. Image Process.
- Pattern Recognit.
- SCIA
- ACCV (4)
- Comput. Aided Geom. Des.
- VISIGRAPP (3: VISAPP)
- IJCAI
- HIS (1)
- Comput. Vis. Graph. Image Process.
- ICIP (6)
- Int. J. Bifurc. Chaos
- WACV
- GMP
- Image Vis. Comput.
- BMVC
- OFC
- 3DV
- Int. J. Appl. Earth Obs. Geoinformation
- SSVM
- MICCAI
- EMMCVPR
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