FIELD EFFECT TRANSISTORS
Experts
- Pierre-Emmanuel Gaillardon
- Vivek De
- Hei Wong
- Masud H. Chowdhury
- Gaudenzio Meneghesso
- Giovanni De Micheli
- Byung-Gook Park
- Chandan Kumar Sarkar
- Tibor Grasser
- Ru Huang
- Thomas Mikolajick
- Ming-Dou Ker
- Sudeb Dasgupta
- Yiming Li
- Ben Kaczer
- Kuniyuki Kakushima
- Seongjae Cho
- Mridula Gupta
- Guangxi Hu
- Guido Groeseneken
- Hiroshi Iwai
- Kaushik Roy
- Krishnan Ravichandran
- Kai Ni
- R. S. Gupta
- David T. Blaauw
- Takayasu Sakurai
- Saibal Mukhopadhyay
- Ran Liu
- Enrico Zanoni
- Yue Hao
- Volkan Kursun
- Ramesh Vaddi
- Jong-Tae Park
- Ching-Te Chuang
- Dennis Sylvester
- James W. Tschanz
- Azzedin D. Es-Sakhi
- C. A. Dimitriadis
Venues
- Microelectron. Reliab.
- Sensors
- Microelectron. J.
- IEEE J. Solid State Circuits
- IEEE Access
- ISCAS
- IEICE Trans. Electron.
- IRPS
- CoRR
- DRC
- IEICE Electron. Express
- ESSDERC
- OFC
- Proc. IEEE
- IET Circuits Devices Syst.
- IEEE Trans. Ind. Electron.
- IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
- NEMS
- ASICON
- EMBC
- VLSI Design
- ISSCC
- Sci. China Inf. Sci.
- IEEE Trans. Very Large Scale Integr. Syst.
- IBM J. Res. Dev.
- CICC
- ICICDT
- ICECS
- ESSCIRC
- IEEE SENSORS
- ECOC
- IECON
- Int. J. Circuit Theory Appl.
- ITC
- VLSI Technology and Circuits
- IEEE Trans. Circuits Syst. I Regul. Pap.
- J. Low Power Electron.
- IEEE Trans. Instrum. Meas.
- Adv. Intell. Syst.
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