FACIAL SURFACE
Experts
- Berk Gökberk
- Michael M. Bronstein
- Lale Akarun
- Alexander M. Bronstein
- Mohamed Daoudi
- Ron Kimmel
- Naoufel Werghi
- Renaud Séguier
- Mohammad H. Mahoor
- Yun Zhang
- Josef Kittler
- Takanori Kochiyama
- Mohammed N. Murtuza
- Massimo Tistarelli
- Haoyu Wang
- Tae-Kyun Kim
- Alberto Del Bimbo
- Reiner Lenz
- George Toderici
- Faisal R. Al-Osaimi
- Mohamed Abdel-Mottaleb
- Hyunwoo Kim
- Hyung-Soo Lee
- Matti Pietikäinen
- Dirk Vandermeulen
- Dakshina Ranjan Kisku
- Guoying Zhao
- Anuj Srivastava
- Nick E. Pears
- Moi Hoon Yap
- Georgios Passalis
- Usama Ijaz Bajwa
- Jinhui Chao
- Catherine Soladié
- Muhammad Sajid
- Xiaobai Li
- Daijin Kim
- Gang Pan
- Naeem Iqbal Ratyal
Venues
- CoRR
- FG
- ICME
- ACM Multimedia
- ICPR
- ICIP
- ICB
- IEEE Trans. Inf. Forensics Secur.
- IEEE Trans. Pattern Anal. Mach. Intell.
- SMC
- ICCV Workshops
- CVPR
- ECCV Workshops (2)
- HCI (1)
- J. Inf. Hiding Multim. Signal Process.
- IROS
- Int. J. Comput. Vis.
- J. Electronic Imaging
- ACM Trans. Graph.
- ICCV
- ISVC (1)
- Appl. Intell.
- NeuroImage
- Image Vis. Comput.
- Pattern Recognit. Lett.
- CVPR Workshops
- SIGGRAPH Posters
- Comput. Electr. Eng.
- ICIP (1)
- Comput. Graph. Forum
- SiPS
- VRCAI
- Three-Dimensional Image Processing (3DIP) and Applications
- ICIG
- Shape Modeling International
- Scale-Space
- RACS
- PSIVT
- SIGGRAPH Talks
Related Topics
Related Keywords
Popularity
No popularities found. Try to change the filters.
Popularity Trend