ERROR MEASURE
Experts
- Enrico Vicario
- Dror Baron
- Laura Carnevali
- Jin Tan
- Dan Geer
- Symeon Papadopoulos
- Mohammad Abdollahi Azgomi
- Amos Lapidoth
- Sankar K. Pal
- Wiro J. Niessen
- Danielle Carmon
- Alexandru C. Telea
- Alec Jacobson
- Ronald R. Yager
- Ian Fischer
- Marco Biagi
- Minos N. Garofalakis
- Alexander A. Alemi
- Rolf Drechsler
- Liangchen Liu
- Claudia D'Ambrosio
- Richard Klavans
- Kensaku Mori
- Yusuke Tamura
- Zhicheng Yang
- Paul S. Heckbert
- Alaa Elobaid
- Neil Jethani
- Hsueh-Ti Derek Liu
- Benjamin Chislett
- Omar Hammami
- Mikael Skoglund
- Jorge Cortés
- Bin Liu
- Alejandro C. Frery
- Michelle Sweering
- Panagiotis Karras
- Raydonal Ospina
- Jun-Ki Min
Venues
- CoRR
- Sensors
- IEEE Access
- EMBC
- QEST
- IEEE Trans. Inf. Theory
- NeuroImage
- ICASSP
- Remote. Sens.
- Pattern Recognit.
- DATE
- J. Digit. Imaging
- IEEE Trans. Instrum. Meas.
- IEEE Trans. Commun.
- IEEE Trans. Software Eng.
- J. Robotics Mechatronics
- Scientometrics
- IEEE Trans. Signal Process.
- ISIT
- Reliab. Eng. Syst. Saf.
- ISBI
- IEEE Trans. Biomed. Eng.
- ISSRE
- login Usenix Mag.
- Numer. Algorithms
- Inf. Sci.
- ITC
- CIARP
- SIAM J. Sci. Comput.
- J. Comput. Phys.
- Appl. Math. Comput.
- IEEE Trans. Image Process.
- SIAM J. Numer. Anal.
- IROS
- Multim. Tools Appl.
- IEICE Trans. Inf. Syst.
- ICRA
- IEEE Trans. Ind. Informatics
- ICCV
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