ELECTRON BEAM
Experts
- David Z. Pan
- Bei Yu
- Georges G. E. Gielen
- Yao-Wen Chang
- Charles Chien
- Zhiwei Xu
- Krishnendu Chakrabarty
- Fumihito Arai
- Shao-Yun Fang
- Toshio Fukuda
- Eby G. Friedman
- Siddharth Garg
- Ge Wang
- Ramesh Karri
- Jhih-Rong Gao
- Nassir Navab
- Farinaz Koushanfar
- Kun Yuan
- S. J. Ben Yoo
- Andreas K. Maier
- John E. Bowers
- A. M. J. Koonen
- Etienne Sicard
- Ulf Schlichtmann
- Hafizur Rahaman
- Alexandre Boyer
- Lihong Zhang
- Kenneth L. Shepard
- Ioannis Savidis
- Martin D. F. Wong
- Makoto Ikeda
- Stephen R. Duncan
- Masahiro Nakajima
- Youngsoo Shin
- Zizheng Cao
- Csaba Andras Moritz
- Mark M. Tehranipoor
- Kunihiro Asada
- Piotr Kmon
Venues
- CoRR
- Sensors
- Microelectron. Reliab.
- OFC
- IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
- NEMS
- IEEE Access
- Microelectron. J.
- IEEE J. Solid State Circuits
- Proc. IEEE
- DAC
- CICC
- IBM J. Res. Dev.
- IEICE Trans. Electron.
- ISCAS
- IEEE Trans. Instrum. Meas.
- ICTON
- ITC
- Symmetry
- J. Comput. Chem.
- IEEE Trans. Medical Imaging
- ICCAD
- Comput. Phys. Commun.
- IEEE Trans. Very Large Scale Integr. Syst.
- VLSI Design
- IEICE Electron. Express
- EMBC
- IEEE SENSORS
- DATE
- ICECS
- IEEE Commun. Mag.
- ISBI
- ISQED
- Int. J. Autom. Technol.
- ECOC
- MIXDES
- 3DIC
- ESSDERC
- IRPS
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