ELECTRICAL PROPERTIES
Experts
- Ralf Behr
- Samuel P. Benz
- Hei Wong
- Alain Rüfenacht
- Charles J. Burroughs Jr.
- Hiroshi Iwai
- George J. Papaioannou
- Volkan Kursun
- Paul D. Dresselhaus
- Kuniyuki Kakushima
- Hitoshi Sasaki
- Hirotake Yamamori
- Yi-Hua Tang
- Matroni Koutsoureli
- Gérard Ghibaudo
- P. T. Lai
- Enrique Miranda
- Shun'ichiro Ohmi
- Ilya F. Budovsky
- Shurong Dong
- Boxue Du
- Clark A. Hamilton
- Vivek De
- Thomas E. Lipe
- Kazuo Tsutsui
- Patrick Pons
- Blaise Jeanneret
- Manfred Klonz
- Piotr S. Filipski
- Dennis Sylvester
- Frederic Monsieur
- Takamasa Kawanago
- James W. Tschanz
- Joseph R. Kinard
- Montserrat Nafría
- Mark S. Humayun
- Anna Zawadzka
- Luis Palafox
- Marco Schubert
Venues
- Microelectron. Reliab.
- Sensors
- IEEE Trans. Instrum. Meas.
- IEEE Access
- Microelectron. J.
- NEMS
- EMBC
- CoRR
- IEICE Trans. Electron.
- IRPS
- IEEE Trans. Ind. Electron.
- ISCAS
- IBM J. Res. Dev.
- CCE
- IEEE Trans. Biomed. Eng.
- IEEE SENSORS
- I2MTC
- IEICE Electron. Express
- Proc. IEEE
- ICTON
- Symmetry
- DRC
- IEEE J. Solid State Circuits
- OFC
- IAS
- ISSCC
- IECON
- VLSI Design
- ESSDERC
- IEEE Trans. Circuits Syst. II Express Briefs
- ICICDT
- IET Circuits Devices Syst.
- IEEE Trans. Very Large Scale Integr. Syst.
- Comput. Phys. Commun.
- Displays
- ESSCIRC
- ICECS
- 3DIC
- CICC
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