ELECTRICAL PROPERTIES
Experts
- Hei Wong
- Samuel P. Benz
- Ralf Behr
- Alain Rüfenacht
- Charles J. Burroughs Jr.
- Hiroshi Iwai
- George J. Papaioannou
- Hitoshi Sasaki
- Paul D. Dresselhaus
- Kuniyuki Kakushima
- Yi-Hua Tang
- Hirotake Yamamori
- Volkan Kursun
- Gérard Ghibaudo
- P. T. Lai
- Matroni Koutsoureli
- Clark A. Hamilton
- Takamasa Kawanago
- Manfred Klonz
- Patrick Pons
- Shurong Dong
- Shun'ichiro Ohmi
- Joseph R. Kinard
- Dennis Sylvester
- James W. Tschanz
- Piotr S. Filipski
- Boxue Du
- Thomas E. Lipe
- Blaise Jeanneret
- Frederic Monsieur
- Enrique Miranda
- Ilya F. Budovsky
- Vivek De
- Montserrat Nafría
- Kazuo Tsutsui
- J. P. Xu
- Yue Hao
- Vincent Huard
- Ivona Z. Mitrovic
Venues
- Microelectron. Reliab.
- Sensors
- IEEE Trans. Instrum. Meas.
- IEEE Access
- Microelectron. J.
- NEMS
- EMBC
- CoRR
- IEICE Trans. Electron.
- IRPS
- IEEE Trans. Ind. Electron.
- ISCAS
- IBM J. Res. Dev.
- CCE
- IEEE Trans. Biomed. Eng.
- I2MTC
- IEEE SENSORS
- IEICE Electron. Express
- Proc. IEEE
- DRC
- ICTON
- Symmetry
- OFC
- IEEE J. Solid State Circuits
- IAS
- IECON
- ISSCC
- ESSDERC
- VLSI Design
- IEEE Trans. Circuits Syst. II Express Briefs
- ICICDT
- IEEE Trans. Very Large Scale Integr. Syst.
- ESSCIRC
- Comput. Phys. Commun.
- Displays
- IET Circuits Devices Syst.
- 3DIC
- ICECS
- SBBD
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