DIFFUSE REFLECTION
Experts
- Katsushi Ikeuchi
- Roberto Mecca
- Junyu Dong
- Yasuyuki Matsushita
- Roberto Cipolla
- Takahiro Okabe
- Shree K. Nayar
- Boxin Shi
- Luc Van Gool
- Ping Tan
- Imari Sato
- Zhong Zhang
- Mike J. Chantler
- Maria Petrou
- Donald P. Greenberg
- Jean-Denis Durou
- Zhenxiong Jian
- Xi Wang
- Tetsuo Miyake
- Yuji Iwahori
- Abhijeet Ghosh
- Csaba D. Tóth
- Fotios Logothetis
- Yvain Quéau
- Osamu Ikeda
- Eli Fox-Epstein
- Toshiaki Tsuji
- Andrew Winslow
- Lin Qi
- Takashi Imamura
- Ilan Shimshoni
- Zhenyu Lu
- Jan J. Koenderink
- Michael Lindenbaum
- Naohiro Ishii
- Carlos E. P. de Oliveira
- Yoichi Sato
- Tesuo Kiuchi
- Ron Kimmel
Venues
- CoRR
- CVPR
- IEEE Trans. Pattern Anal. Mach. Intell.
- ICCV
- IEEE Trans. Image Process.
- ACM Trans. Graph.
- MVA
- IEEE Trans. Instrum. Meas.
- WACV
- Mach. Vis. Appl.
- Remote. Sens.
- Int. J. Comput. Vis.
- Sensors
- ISBI
- IGARSS
- ECCV (2)
- ICRA
- SIGGRAPH
- IEEE Geosci. Remote. Sens. Lett.
- BMVC
- Comput. Graph. Forum
- IEEE Trans. Geosci. Remote. Sens.
- Pattern Recognit. Lett.
- ICIA
- VISIGRAPP (4: VISAPP)
- IEEE Trans. Vis. Comput. Graph.
- ACIVS
- IEEE Access
- Comput. Vis. Image Underst.
- J. Imaging
- Systems and Computers in Japan
- VISAPP (1)
- CGIV
- ICIAP
- ICIAP (1)
- SIAM Rev.
- CIC
- VISAPP (2)
- HCI (16)
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