DIFFUSE REFLECTANCE
Experts
- Paul E. Debevec
- Abhijeet Ghosh
- Pieter Peers
- Graham Fyffe
- Ko Nishino
- Katsushi Ikeuchi
- Shree K. Nayar
- Jonathan T. Barron
- Kiran B. Raja
- Borom Tunwattanapong
- Xiuming Zhang
- Pratul P. Srinivasan
- Koichiro Deguchi
- Takayuki Okatani
- Zhi-Song Liu
- Jag Mohan Singh
- Chu-Tak Li
- Raghavendra Ramachandra
- Li-Wen Wang
- Christoph Busch
- Reinhard Klein
- Boyang Deng
- Qinhuo Liu
- Gilles Pitard
- Stephen Lombardi
- Ron Kimmel
- Xin Tong
- Edwin R. Hancock
- Stefanos Zafeiriou
- Toshikazu Wada
- Stamatios Georgoulis
- Osamu Ikeda
- Jan-Peter Muller
- Narendra Ahuja
- Giuseppe Claudio Guarnera
- Michael S. Langer
- Imari Sato
- Jan J. Koenderink
- Haruo Takemura
Venues
- CoRR
- CVPR
- Remote. Sens.
- Sensors
- ICCV
- IGARSS
- ACM Trans. Graph.
- IEEE Trans. Pattern Anal. Mach. Intell.
- 3DV
- Comput. Graph. Forum
- Comput. Electron. Agric.
- EMBC
- IEEE Trans. Geosci. Remote. Sens.
- Comput. Vis. Image Underst.
- SIGGRAPH Talks
- Comput. Graph.
- Rendering Techniques
- SIGGRAPH Posters
- BMVC
- ICIP
- MVA
- CIC
- Measuring, Modeling, and Reproducing Material Appearance
- ICPR (1)
- CVPR (1)
- IEEE Trans. Instrum. Meas.
- IEEE Trans. Vis. Comput. Graph.
- Comput. Aided Des.
- ICPR
- IROS
- IEEE Computer Graphics and Applications
- CGIV
- IEEE Geosci. Remote. Sens. Lett.
- IEEE Trans. Image Process.
- IAS
- Displays
- ECCV (2)
- Int. J. Appl. Earth Obs. Geoinformation
- Mach. Vis. Appl.
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