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Experts
- Daniel Cremers
- Trevor Darrell
- Julien N. P. Martel
- Masatoshi Ishikawa
- In So Kweon
- Stephen J. Carey
- Lorenz K. Müller
- Piotr Dudek
- Jonathan Müller
- Zijin Wu
- Ren Wang
- Juewen Peng
- Paulo Jorge Ramalho Oliveira
- Mirbek Turduev
- Jaeheung Surh
- Shree K. Nayar
- Byoungnam Kim
- Devin Guillory
- Laura Leal-Taixé
- Yu-Lun Liu
- Yu-Hao Huang
- Hiroshi Kawasaki
- Kristin Knorr
- Ning-Hsu Wang
- Martin Benning
- Hamza Kurt
- Heidrun Schumann
- Irene Parada
- Chan-Byoung Chae
- Michael Möller
- Caner Hazirbas
- Zhiguo Cao
- Yang Yang
- Dong Ku Kim
- Sunghoon Im
- Vongani H. Maluleke
- Angjoo Kanazawa
- Aydin S. Evren
- Dongsoo Jun
Venues
- CoRR
- Sensors
- SIGGRAPH Posters
- CVPR
- IEEE Access
- IEEE Trans. Biomed. Eng.
- OFC
- ICRA
- Microelectron. Reliab.
- EMBC
- IEEE SENSORS
- Pattern Recognit. Lett.
- ISCAS
- ITCS
- Comput. Graph. Forum
- CHI
- IEEE Trans. Image Process.
- VR
- Inf. Fusion
- Micromachines
- IEEE Trans. Pattern Anal. Mach. Intell.
- Image Vis. Comput.
- ICIP
- Symmetry
- ICTON
- MIPRO
- ISPRS Int. J. Geo Inf.
- Int. J. Medical Eng. Informatics
- J. Sci. Res.
- Soc. Netw. Anal. Min.
- IEICE Trans. Inf. Syst.
- Vis. Comput.
- ICCCN
- HICSS
- SocInfo (2)
- TASS@SEPLN
- RFID
- Graph Drawing
- J. Comput. Sci. Technol.
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