DENSE SAMPLING
Experts
- Moncef Gabbouj
- Martin Vetterli
- Alexandros Iosifidis
- Ayush Bhandari
- Nikolaos Passalis
- Anastasios Tefas
- Ramesh Raskar
- Felix Krahmer
- Andrew J. Davison
- Jenni Raitoharju
- Zhong Liu
- Maya Ramanath
- Matthew A. Prelee
- Feng Xi
- André Kaup
- Shengyao Chen
- Srikanta Bedathur
- Suling Zhang
- Amitabha Bagchi
- Yonina C. Eldar
- Neha Sengupta
- Sundeep Prabhakar Chepuri
- Jürgen Seiler
- Holger Boche
- Cordelia Schmid
- Volker Pohl
- David Francis Walnut
- David L. Neuhoff
- Michael Bloesch
- Zhouhui Lian
- Tianming Liu
- Xing Hu
- Christoph Beierle
- Xianfang Sun
- Götz E. Pfander
- Yang Wang
- Hidenobu Matsuki
- Zhen Qian
- Markus Jonscher
Venues
- CoRR
- ICASSP
- IEEE Trans. Signal Process.
- ICIP
- Neurocomputing
- ICPR
- EUSIPCO
- IEEE Signal Process. Lett.
- GlobalSIP
- IEEE Trans. Inf. Theory
- CVPR
- ACM Multimedia
- Sensors
- HPCA
- IROS
- Int. J. Comput. Vis.
- VCIP
- BMVC
- ACM Trans. Graph.
- Comput. Graph. Forum
- VISAPP (1)
- Expert Syst. Appl.
- ICIG
- 3DV
- IEEE Trans. Geosci. Remote. Sens.
- IEEE Robotics Autom. Lett.
- Vis. Comput.
- IET Comput. Vis.
- IEICE Trans. Inf. Syst.
- Discret. Appl. Math.
- ISBI
- Knowl. Based Syst.
- IEEE Trans. Very Large Scale Integr. Syst.
- ICIMCS
- ICCV Workshops
- IEEE Trans. Vis. Comput. Graph.
- Evol. Intell.
- IEEE Trans. Knowl. Data Eng.
- IEEE Trans. Circuits Syst. II Express Briefs
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