CUSTOMER CHURN
Experts
- Dirk Van den Poel
- Bart Baesens
- Sajid Anwar
- Adnan Amin
- Jerry Fjermestad
- Wouter Verbeke
- Nicholas C. Romano Jr.
- Kristof Coussement
- Koen W. De Bock
- Alan D. Smith
- Rainer Alt
- Bing Quan Huang
- Yanbo J. Wang
- Asifullah Khan
- Seppe vanden Broucke
- Vadlamani Ravi
- M. Tahar Kechadi
- Brian Buckley
- David C. Yen
- Adnan Idris
- Changez Khan
- Jan Vanthienen
- Tommi Laukkanen
- David Martens
- Lutz M. Kolbe
- Juan Lei
- María Óskarsdóttir
- Babar Shah
- Shan Ling Pan
- Abbas Keramati
- Eugen Stripling
- Jiayin Qi
- Yao Lu
- Byunggu Yu
- Jae-Nam Lee
- Xianquan Zhang
- Amir Hussain
- Stefan Lessmann
- Wanshan Yang
Venues
- CoRR
- Expert Syst. Appl.
- IEEE Access
- HICSS
- Eur. J. Oper. Res.
- ECIS
- Remote. Sens.
- Neural Comput. Appl.
- PACIS
- AMCIS
- Decis. Support Syst.
- Bus. Process. Manag. J.
- Multim. Tools Appl.
- Int. J. Bus. Inf. Syst.
- HMD Prax. Wirtsch.
- SIU
- Sensors
- ITSC
- Int. J. Inf. Manag.
- ASONAM
- SMC
- Eng. Appl. Artif. Intell.
- Mark. Sci.
- EMBC
- Inf. Manag.
- Int. J. Mob. Commun.
- J. Intell. Fuzzy Syst.
- Int. J. E Bus. Res.
- ICDM Workshops
- Electron. Mark.
- IEEE BigData
- Ind. Manag. Data Syst.
- J. Theor. Appl. Electron. Commer. Res.
- J. Big Data
- Entropy
- Appl. Soft Comput.
- Kybernetes
- Manag. Sci.
- IJCNN
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