CROSS BIN
Experts
- Sung-Hyuk Cha
- Zhensheng Yang
- Min Yang
- Yaohong Jin
- Kouichi Hirata
- Thomas Seidl
- Takayasu Fushimi
- Francesc Serratosa
- Xiaokang Liu
- Sargur N. Srihari
- Kazumi Saito
- Honghong Zhao
- Ruifeng Xu
- Jianquan Li
- Takuya Yoshino
- Long Wang
- Denis Hamad
- Yuanyuan Wang
- Sungsoo Yoon
- Rajat Subhra Chakraborty
- Shenglong Zhuo
- Yan Yan
- Pawel Forczmanski
- Anca Maria Ivanescu
- Ofir Pele
- Vinh Truong Hoang
- Odysseas Kechagias-Stamatis
- R. Ockert
- Taiga Nakamura
- Pierre Gançarski
- Dariusz Frejlichowski
- Li Guo
- Chaoxin Lyu
- Zhihong Lin
- Nicolas Vandenbroucke
- Pilar Arques
- Feng Li
- Yu Ma
- Alberto Sanfeliu
Venues
- SSPR/SPR
- ICIP
- ICPR
- IET Image Process.
- VISAPP (1)
- DS
- ECCV (2)
- Computing
- Intell. Data Anal.
- KDIR
- IP&C
- J. Inf. Telecommun.
- BTW
- IEEE Trans. Ind. Electron.
- Pattern Recognit.
- IC-AI
- Comput. Vis. Image Underst.
- Elektron. Rechenanlagen
- ICRA
- ISCAS
- Int. J. Pattern Recognit. Artif. Intell.
- EMNLP (1)
- DCAI (1)
- IEEE Trans. Instrum. Meas.
- IEEE METRICS
- Artif. Life Robotics
- J. Imaging
- FSKD
- Pattern Recognit. Lett.
- CoRR
- IEEE Trans. Pattern Anal. Mach. Intell.
- ACM Multimedia
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