CROSS BIN
Experts
- Sung-Hyuk Cha
- Jianquan Li
- Francesc Serratosa
- Sargur N. Srihari
- Min Yang
- Yaohong Jin
- Kazumi Saito
- Takayasu Fushimi
- Takuya Yoshino
- Kouichi Hirata
- Zhensheng Yang
- Thomas Seidl
- Ruifeng Xu
- Honghong Zhao
- Xiaokang Liu
- Feng Li
- Gerard Sanroma
- Yu Ma
- Anne Puissant
- Pilar Arques
- Ying Chen
- Ou Wu
- Rajat Subhra Chakraborty
- Nicolas Passat
- Norimichi Tsumura
- Denis Hamad
- Jiqing Xu
- Pawel Forczmanski
- Ido Leichter
- Zhonghua Yu
- Seiya Okubo
- Shoji Ezaki
- Hiroshi Motoda
- Nicolas Vandenbroucke
- Yan Yan
- Kohei Muraka
- Ming Yang
- Shoji Yamamoto
- Wei Yan
Venues
- ICIP
- SSPR/SPR
- ICPR
- IEEE METRICS
- ECCV (2)
- DS
- DCAI (1)
- IEEE Trans. Instrum. Meas.
- Elektron. Rechenanlagen
- Artif. Life Robotics
- J. Inf. Telecommun.
- J. Imaging
- EMNLP (1)
- Int. J. Pattern Recognit. Artif. Intell.
- BTW
- KDIR
- Computing
- IET Image Process.
- ISCAS
- Pattern Recognit. Lett.
- IC-AI
- ACM Multimedia
- Comput. Vis. Image Underst.
- VISAPP (1)
- ICRA
- CoRR
- Pattern Recognit.
- IEEE Trans. Ind. Electron.
- IP&C
- IEEE Trans. Pattern Anal. Mach. Intell.
- FSKD
- Intell. Data Anal.
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