CONNECTED COMPONENT LABELING
Experts
- Lifeng He
- Yuyan Chao
- Costantino Grana
- Lionel Lacassagne
- Kenji Suzuki
- Federico Bolelli
- Xiao Zhao
- Bin Yao
- Stefano Allegretti
- Laurent Cabaret
- Michele Cancilla
- Giuseppe F. Italiano
- Lorenzo Baraldi
- Loukas Georgiadis
- Prabir Bhattacharya
- Dan Schonfeld
- Péter Balázs
- Daniel Etiemble
- Tetsuo Asano
- Robert E. Tarjan
- Wei Lu
- Oded Green
- Daniele Borghesani
- Yang Wang
- Marcin Kowalczyk
- Alok N. Choudhary
- Kuo-Chin Fan
- Tomasz Kryjak
- Rita Cucchiara
- Marie-Françoise Roy
- Evangelos Kosinas
- Binhai Zhu
- Florian Lemaitre
- Phalguni Gupta
- Graham M. Megson
- Jaekyu Ha
- Ihsin T. Phillips
- Ronald Lumia
- Sei Naito
Venues
- CoRR
- Pattern Recognit.
- IEEE Trans. Image Process.
- ICIP
- ICPR
- ICASSP
- Pattern Recognit. Lett.
- Inf. Process. Lett.
- Image Vis. Comput.
- Comput. Vis. Image Underst.
- J. Math. Imaging Vis.
- ISCAS
- Systems and Computers in Japan
- IEEE Trans. Pattern Anal. Mach. Intell.
- J. Parallel Distributed Comput.
- CAIP
- Comput. Vis. Graph. Image Process.
- Electron. Notes Discret. Math.
- J. Real Time Image Process.
- ESA
- ICPR (2)
- Inf. Sci.
- SIAM J. Comput.
- J. Vis. Commun. Image Represent.
- Multim. Tools Appl.
- SIGARCH Comput. Archit. News
- Commun. ACM
- Discret. Math.
- SIAM J. Discret. Math.
- Comput. J.
- IEEE Trans. Parallel Distributed Syst.
- IEEE Access
- IEICE Trans. Inf. Syst.
- SPAA
- IEEE Trans. Signal Process.
- ICIAP Workshops
- CVPR
- WG
- Networks
Related Topics
Related Keywords
Popularity
No popularities found. Try to change the filters.
Popularity Trend