CONNECTED COMPONENT LABELING
Experts
- Lifeng He
- Yuyan Chao
- Costantino Grana
- Lionel Lacassagne
- Kenji Suzuki
- Federico Bolelli
- Bin Yao
- Xiao Zhao
- Stefano Allegretti
- Michele Cancilla
- Laurent Cabaret
- Prabir Bhattacharya
- Giuseppe F. Italiano
- Lorenzo Baraldi
- Loukas Georgiadis
- Tetsuo Asano
- Dan Schonfeld
- Daniel Etiemble
- Péter Balázs
- Yang Wang
- Oded Green
- Tomasz Kryjak
- Binhai Zhu
- Marie-Françoise Roy
- Evangelos Kosinas
- Kuo-Chin Fan
- Daniele Borghesani
- Florian Lemaitre
- Robert E. Tarjan
- Alok N. Choudhary
- Wei Lu
- Rita Cucchiara
- Marcin Kowalczyk
- Douglas B. West
- Vibhor Rastogi
- Hiroshi Sankoh
- Houari Sabirin
- Kesheng Wu
- Robert M. Haralick
Venues
- CoRR
- Pattern Recognit.
- IEEE Trans. Image Process.
- ICPR
- ICIP
- ICASSP
- Pattern Recognit. Lett.
- Inf. Process. Lett.
- Image Vis. Comput.
- Comput. Vis. Image Underst.
- Systems and Computers in Japan
- IEEE Trans. Pattern Anal. Mach. Intell.
- ISCAS
- J. Math. Imaging Vis.
- CAIP
- Electron. Notes Discret. Math.
- J. Parallel Distributed Comput.
- Comput. Vis. Graph. Image Process.
- J. Real Time Image Process.
- SIGARCH Comput. Archit. News
- ESA
- ICPR (2)
- J. Vis. Commun. Image Represent.
- SIAM J. Comput.
- Inf. Sci.
- Multim. Tools Appl.
- IEEE Trans. Parallel Distributed Syst.
- Discret. Math.
- SPAA
- Commun. ACM
- SIAM J. Discret. Math.
- IEEE Access
- IEICE Trans. Inf. Syst.
- Comput. J.
- DATE
- Computing
- DGCI
- ICDAR
- CVGIP Graph. Model. Image Process.
Related Topics
Related Keywords
Popularity
No popularities found. Try to change the filters.
Popularity Trend