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Experts
- Josef Kittler
- Erik Cuevas
- Marco A. Pérez Cisneros
- Daniel Zaldivar
- Mauro Carlo Beltrametti
- Anna Maria Massone
- Mark B. Sandler
- Mark S. Nixon
- John Illingworth
- Azriel Rosenfeld
- Dmitry P. Nikolaev
- Nicolás Guil
- Zhanyi Hu
- Nahum Kiryati
- Hiroyasu Koshimizu
- Emilio L. Zapata
- Mohammed Atiquzzaman
- John N. Carter
- Kazuhito Murakami
- Cristina Campi
- Luc Van Gool
- Songde Ma
- Alfred M. Bruckstein
- Thambipillai Srikanthan
- John Princen
- Raymond K. K. Yip
- Koji Nakano
- Luciano da Fontoura Costa
- Ravi Kumar Satzoda
- Heikki Kälviäinen
- Aparecido Nilceu Marana
- Taylan O. Gulum
- Marta Penas
- Shiu Yin Yuen
- Yasuaki Ito
- E. R. Davies
- Atsushi Imiya
- María J. Carreira
- Catherine Achard
Venues
- Pattern Recognit. Lett.
- CoRR
- Pattern Recognit.
- ICASSP
- IEEE Trans. Pattern Anal. Mach. Intell.
- ICPR
- Image Vis. Comput.
- ICIP
- MVA
- Sensors
- Comput. Vis. Graph. Image Process.
- BMVC
- Comput. Vis. Image Underst.
- Real Time Imaging
- ICPR (3)
- ICIP (2)
- Mach. Vis. Appl.
- Signal Process.
- IEEE Access
- IEEE Geosci. Remote. Sens. Lett.
- Systems and Computers in Japan
- IEEE Trans. Image Process.
- ICCV
- ICPR (1)
- IGARSS
- EUSIPCO
- SIU
- DAGM-Symposium
- CVPR
- Remote. Sens.
- ICPR (2)
- IPTA
- Comput. Electron. Agric.
- ICIP (3)
- IROS
- Pattern Anal. Appl.
- J. Math. Imaging Vis.
- J. Parallel Distributed Comput.
- ISCAS
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