CAD CAM
Experts
- Theo Theocharides
- Habib Mehrez
- Les A. Piegl
- Husain Parvez
- Zied Marrakchi
- Randy H. Katz
- Miodrag Potkonjak
- Bruce C. Kim
- Edwin Hsing-Mean Sha
- Giampio Bracchi
- Ellis E. Chang
- William C. Regli
- Adarsh Krishnamurthy
- Sri Parameswaran
- Harald Eufinger
- Michael Wehmöller
- Jae-Jin Lee
- Wayne Tiller
- Soonhung Han
- Alison Olechowski
- Cristina Silvano
- Michihiro Koibuchi
- Rynson W. H. Lau
- Hiroki Matsutani
- Stephan Weihe
- Alice C. Parker
- Peter R. Cappello
- Enrico Macii
- In-Cheol Park
- Luca Benini
- Fei Sun
- Harold Joseph Highland
- Gi-Yong Song
- Ahmed Amine Jerraya
- Margrethe H. Olson
- Seung Ho Hwang
- Srivaths Ravi
- Anand Raghunathan
- Hideharu Amano
Venues
- DAC
- Comput. Aided Des.
- CoRR
- IEEE Des. Test Comput.
- ICCAD
- Int. J. Geogr. Inf. Sci.
- Trans. GIS
- Comput. Graph.
- ISPRS Int. J. Geo Inf.
- FMCAD
- IFIP Congress
- IGARSS
- DATE
- ASAP
- IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
- AGIT Journal Angew. Geoinformatik
- J. Comput. Inf. Sci. Eng.
- ACM Annual Conference
- AFIPS National Computer Conference
- IEEE Computer Graphics and Applications
- FPL
- Computer
- Comput. Environ. Urban Syst.
- IEEE Des. Test
- GIL Jahrestagung
- ICCD
- VLSI Design
- Eng. Comput.
- IEEE Access
- Ann. GIS
- Cartogr. Int. J. Geogr. Inf. Geovisualization
- Comput. Geosci.
- Comput. Appl. Eng. Educ.
- ICC
- ACM Conference on Computer Science
- SIGGRAPH
- Proc. IEEE
- IEEE Trans. Very Large Scale Integr. Syst.
- Environ. Model. Softw.
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