BIOMETRIC IDENTIFICATION
Experts
- Christoph Busch
- David Zhang
- Adam Czajka
- Christian Rathgeb
- Kevin W. Bowyer
- Ajay Kumar
- Tieniu Tan
- Phalguni Gupta
- Mark S. Nixon
- Anil K. Jain
- Julian Fiérrez
- Zhenan Sun
- Marina L. Gavrilova
- Arun Ross
- Mateusz Trokielewicz
- Raul Sánchez-Reillo
- Patrick J. Flynn
- Norman Poh
- Richa Singh
- Piotr Maciejewicz
- Mayank Vatsa
- Javier Ortega-Garcia
- Bernadette Dorizzi
- Michele Nappi
- Ramachandra Raghavendra
- Nalini K. Ratha
- Maria De Marsico
- Andreas Uhl
- Jean-Luc Dugelay
- Marcos Faúndez-Zanuy
- John N. Carter
- Naser Damer
- Nasser M. Nasrabadi
- Aythami Morales
- Josef Kittler
- Yongzhen Huang
- Rubén Vera-Rodríguez
- Jiankun Hu
- Svetlana N. Yanushkevich
Venues
- CoRR
- IEEE Trans. Inf. Forensics Secur.
- Pattern Recognit. Lett.
- Pattern Recognit.
- ICPR
- IEEE Access
- Sensors
- ICB
- BTAS
- Multim. Tools Appl.
- BIOSIG
- IJCB
- Int. J. Biom.
- IET Biom.
- AVBPA
- IEEE Trans. Pattern Anal. Mach. Intell.
- EUSIPCO
- CVPR Workshops
- ICIP
- CCBR
- Comput. Secur.
- ICCST
- IWBF
- WACV
- ICASSP
- Expert Syst. Appl.
- IEEE Trans. Biom. Behav. Identity Sci.
- Signal Image Video Process.
- SMC
- IEEE Trans. Instrum. Meas.
- Computer
- Image Vis. Comput.
- J. Electronic Imaging
- IJCNN
- WIFS
- Neurocomputing
- IACR Cryptol. ePrint Arch.
- CVPR
- IIH-MSP
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