BILATERAL SYMMETRY
Experts
- Jianzhuang Liu
- P. A. C. Varley
- Xiaoou Tang
- Ralph R. Martin
- Andrzej Pelc
- Jean-Yves Ramel
- Clifford A. Reiter
- Seok-Hee Hong
- Symmetry Editorial Office
- Liangliang Cao
- Hiromasa Suzuki
- Toby Walsh
- Vishvjit S. Nalwa
- Marcelo Cicconet
- Renju Li
- Blerta Lindqvist
- Alice Silverberg
- Sayan Mitra
- Frantisek Kardos
- Hendrik W. Lenstra Jr.
- Marc Noy
- Peter B. Scott
- Yanxi Liu
- Aaron Hertzmann
- Hongbin Zha
- Seungyong Lee
- Tao Luo
- Hari C. Reddy
- Emanuele G. Fusco
- Bart Bogaerts
- Sylvain Prima
- Lan-Da Van
- William E. Rothfus
- Zhi Tang
- Chengze Li
- Evelyne Hubert
- Hussein Sibai
- Robert T. Collins
- Kevin C. Jones
Venues
- Symmetry
- CoRR
- IEEE Trans. Pattern Anal. Mach. Intell.
- Discret. Math.
- Discret. Comput. Geom.
- CVPR
- J. Comb. Theory, Ser. A
- Comput. Graph. Forum
- Entropy
- Comput. Graph.
- Appl. Math. Comput.
- Int. J. Bifurc. Chaos
- Electron. J. Comb.
- ACM Trans. Graph.
- Vis. Comput.
- ISBI
- GREC
- ICPR
- Medical Imaging: Image Processing
- Pattern Recognit.
- IROS
- Sensors
- J. Comput. Chem.
- ICIP
- Eur. J. Comb.
- SIAM J. Math. Anal.
- Pattern Recognit. Lett.
- Int. J. Comput. Vis.
- EMBC
- Robotica
- IJCAI
- Quantum
- Comput. Vis. Graph. Image Process.
- Am. Math. Mon.
- Theor. Comput. Sci.
- Adv. Appl. Math.
- AAAI
- ISSAC
- CCCG
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