AUTOMATIC SCALE SELECTION
Experts
- Tony Lindeberg
- Bart M. ter Haar Romeny
- Luc Florack
- Max A. Viergever
- Atsushi Imiya
- Tomoya Sakai
- Nir A. Sochen
- Arjan Kuijper
- Marco Loog
- Jan J. Koenderink
- Jinhai Li
- Alfons H. Salden
- J. Andrew Bangham
- Frans Kanters
- Bao Qing Hu
- Jean-Michel Morel
- Sonya A. Coleman
- Richard W. Harvey
- Michael Brady
- Kim Steenstrup Pedersen
- Lance R. Williams
- Mads Nielsen
- Ali Shokoufandeh
- Sung Ha Kang
- Yuchen He
- Madonna G. Herron
- Songde Ma
- Christopher L. Wyatt
- Yaorong Ge
- Bryan W. Scotney
- Chen Sagiv
- Jun Liu
- Hanqing Lu
- Carlos Lopez-Molina
- Thomas H. Williamson
- Gabriel Peyré
- Koji Ichii
- Walter G. Kropatsch
- Sarah Barman
Venues
- CoRR
- Scale-Space
- ICIP
- J. Math. Imaging Vis.
- IEEE Trans. Pattern Anal. Mach. Intell.
- SSVM
- CVPR
- Pattern Recognit.
- ICPR
- ICASSP
- Image Vis. Comput.
- Pattern Recognit. Lett.
- Int. J. Comput. Vis.
- ICCV
- IEEE Trans. Image Process.
- ECCV (1)
- Int. J. Approx. Reason.
- Comput. Graph. Forum
- Mach. Vis. Appl.
- CAIP
- Remote. Sens.
- DAGM-Symposium
- IROS
- IEEE Trans. Vis. Comput. Graph.
- EUSIPCO
- Neurocomputing
- Sensors
- AAAI
- INTERSPEECH
- Inf. Sci.
- ACCV (2)
- ISBI
- Knowl. Based Syst.
- Medical Imaging: Image Processing
- BMVC
- DICTA
- ECCV (2)
- J. WSCG
- Int. J. Wavelets Multiresolution Inf. Process.
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