AUTOMATIC SCALE SELECTION
Experts
- Tony Lindeberg
- Bart M. ter Haar Romeny
- Luc Florack
- Max A. Viergever
- Atsushi Imiya
- Tomoya Sakai
- Alfons H. Salden
- Jinhai Li
- Marco Loog
- Frans Kanters
- Arjan Kuijper
- Jan J. Koenderink
- J. Andrew Bangham
- Nir A. Sochen
- Mads Nielsen
- Ali Shokoufandeh
- Yaorong Ge
- Bao Qing Hu
- Songde Ma
- Sonya A. Coleman
- Madonna G. Herron
- Sung Ha Kang
- Kim Steenstrup Pedersen
- Lance R. Williams
- Yuchen He
- Bryan W. Scotney
- Richard W. Harvey
- Christopher L. Wyatt
- Michael Brady
- Jean-Michel Morel
- Ylva Jansson
- Michele Ceccarelli
- Kathryn Heal
- Stefan Heldmann
- Hyungtae Lim
- Narendra Ahuja
- D. Alex Quistberg
- Thomas H. Williamson
- Charles Kervrann
Venues
- CoRR
- Scale-Space
- ICIP
- J. Math. Imaging Vis.
- SSVM
- IEEE Trans. Pattern Anal. Mach. Intell.
- CVPR
- ICPR
- Pattern Recognit.
- ICASSP
- Image Vis. Comput.
- Pattern Recognit. Lett.
- Int. J. Comput. Vis.
- ICCV
- IEEE Trans. Image Process.
- Int. J. Approx. Reason.
- ECCV (1)
- Comput. Graph. Forum
- Remote. Sens.
- Mach. Vis. Appl.
- DAGM-Symposium
- IROS
- IEEE Trans. Vis. Comput. Graph.
- CAIP
- ACCV (2)
- BMVC
- ECCV (2)
- EUSIPCO
- Medical Imaging: Image Processing
- AAAI
- Neurocomputing
- INTERSPEECH
- Sensors
- ISBI
- Knowl. Based Syst.
- DICTA
- Inf. Sci.
- J. WSCG
- CAIP (2)
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