ARC LENGTH
Experts
- Farzin Mokhtarian
- Sadegh Abbasi
- Bert Jüttler
- Ron Goldman
- Josef Kittler
- Faouzi Ghorbel
- Stefanos D. Kollias
- Zbynek Sír
- Horace Ho-Shing Ip
- Thomas Lewiner
- Michael M. Bronstein
- John A. Roulier
- Ron Kimmel
- Anuj Srivastava
- Emil Zagar
- Baojiang Zhong
- Alan K. Mackworth
- Marcos Craizer
- Xiaohong Jia
- Dinggang Shen
- Santiago Betelú
- Dan Raviv
- Hsien-Chih Chang
- Herbert Edelsbrunner
- Gregory Dudek
- Allen R. Tannenbaum
- Mangayarkarasi Ramaiah
- Gabriel Altmann
- Guillermo Sapiro
- Riku Suomela
- Yannis Avrithis
- Alexandru C. Telea
- Juan Gerardo Alcázar
- Jeff Erickson
- Rida T. Farouki
- Maher Ahmed
- Ioan-Iovitz Popescu
- Alexander M. Bronstein
- Mohamed Daoudi
Venues
- CoRR
- Comput. Aided Geom. Des.
- Comput. Aided Des.
- IEEE Trans. Pattern Anal. Mach. Intell.
- Pattern Recognit.
- Appl. Math. Comput.
- CVPR
- J. Math. Imaging Vis.
- Pattern Recognit. Lett.
- Image Vis. Comput.
- ICCV
- Int. J. Comput. Vis.
- Shape Modeling International
- Discret. Comput. Geom.
- BMVC
- Comput. Graph.
- ICPR (1)
- Computing
- Int. J. Bifurc. Chaos
- IEEE Computer Graphics and Applications
- Vis. Comput.
- ICIP
- Comput. Math. Appl.
- Comput. Vis. Image Underst.
- Am. Math. Mon.
- J. Comput. Appl. Math.
- Finite Fields Their Appl.
- ICPR
- IEEE Trans. Image Process.
- Int. J. Comput. Vis. Robotics
- ICASSP
- IbPRIA
- Autom.
- ACC
- SIAM J. Math. Anal.
- Glottometrics
- J. Softw.
- Eur. J. Comb.
- SoCG
Related Topics
Related Keywords
Popularity
No popularities found. Try to change the filters.
Popularity Trend