Asymptotic Characterization of Localized Defect Modes: Su-Schrieffer-Heeger and Related Models.

Richard V. Craster Bryn Davies

Published in: Multiscale Model. Simul. (2023)

Keyphrases

prior knowledge
real time
multiscale
expert systems
probabilistic model
model selection
closely related
statistical models
data mining
machine learning
search engine
experimental data
machine vision
autoregressive