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Multilevel Dual-Channel NAND Flash Memories with High Read and Program Verifying Speeds Utilizing Asymmetrically-Doped Channel Regions.

Joung Woo LeeJoo Hyung YouSang Hyun JangKae-Dal KwackTae-Whan Kim
Published in: IEICE Trans. Electron. (2010)
Keyphrases
  • dual channel
  • wide range
  • disk drives
  • high speed
  • model checking
  • region of interest
  • flash memory
  • low power consumption
  • database
  • image features
  • test cases
  • application programs