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Multilevel Dual-Channel NAND Flash Memories with High Read and Program Verifying Speeds Utilizing Asymmetrically-Doped Channel Regions.
Joung Woo Lee
Joo Hyung You
Sang Hyun Jang
Kae-Dal Kwack
Tae-Whan Kim
Published in:
IEICE Trans. Electron. (2010)
Keyphrases
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dual channel
wide range
disk drives
high speed
model checking
region of interest
flash memory
low power consumption
database
image features
test cases
application programs