An Algorithm for Diagnosing Transistor Shorts Using Gate-level Simulation.
Yoshinobu HigamiKewal K. SalujaHiroshi TakahashiShin-ya KobayashiYuzo TakamatsuPublished in: IPSJ Trans. Syst. LSI Des. Methodol. (2009)
Keyphrases
- detection algorithm
- computational cost
- optimal solution
- learning algorithm
- computational complexity
- search space
- np hard
- times faster
- objective function
- segmentation algorithm
- theoretical analysis
- computationally efficient
- expectation maximization
- high accuracy
- recognition algorithm
- experimental evaluation
- dynamic programming
- cost function
- artificial neural networks
- preprocessing
- convergence rate
- simulation study
- mathematical analysis
- artificial fish
- path planning
- matching algorithm
- input data
- linear programming
- simulated annealing
- probabilistic model
- significant improvement
- data structure