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An Expression's Single Fault Model and the Testing Methods.

Yunzhan GongWanli XuXiaowei Li
Published in: Asian Test Symposium (2003)
Keyphrases
  • fault model
  • preprocessing
  • benchmark datasets
  • data sets
  • neural network
  • face recognition
  • high dimensional
  • control system
  • significant improvement
  • high dimensional data
  • conflict resolution