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Standard cell library based layout characterization and power analysis for 10nm gate-all-around (GAA) transistors.
Luhao Wang
Tiansong Cui
Shahin Nazarian
Yanzhi Wang
Massoud Pedram
Published in:
SoCC (2016)
Keyphrases
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cmos technology
power analysis
differential power analysis
countermeasures
metal oxide semiconductor
low power
databases
inter cell
database systems
low cost
high density
image sensor
nm technology