An Improved Technique to Assess AC Performance of a Submicron GaN HEMTs.

Saif-Ur Rehman Hafiz Fuad Usman Umer Farooq Ahmed M. Asif Soo Young Shin

Published in: ICTC (2019)

Keyphrases

image sequences
vlsi circuits
three dimensional
structuring elements
electron beam
genetic algorithm
image processing
cost function
np hard
probabilistic model