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Atomic Force Microscopy Sidewall Imaging with a Quartz Tuning Fork Force Sensor.

Danish HussainYongbing WenHao ZhangJianmin SongHui Xie
Published in: Sensors (2018)
Keyphrases
  • atomic force microscopy
  • contact force
  • sensor networks
  • multi sensor
  • sensor data
  • parameter settings
  • real time
  • parameter tuning
  • image sensor
  • sensor fusion
  • image capture
  • state space search
  • rule selection